Majewski, P.
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2

Secondary scintillation properties of multi-layer THGEMs op..:

Cortesi, M. ; Sims, H. ; Pereira, J....
Journal of Instrumentation.  18 (2023)  8 - p. P08005 , 2023
 
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3

Combine 4D STEM and EELS Using a Fast Pixelated Direct Dete..:

Huth, M ; Eckert, B ; Aschauer, S...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 401-402 , 2023
 
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4

How to Count Electrons with Pixelated Semiconductor Detecto..:

Eckert, B ; Aschauer, S ; Huth, M...
Microscopy and Microanalysis.  29 (2023)  Supplement_1 - p. 705-706 , 2023
 
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6

Electron Image Reconstruction for Pixelated Semiconductor T..:

Eckert, B ; Aschauer, S ; Hedley, E...
Microscopy and Microanalysis.  28 (2022)  S1 - p. 3040-3042 , 2022
 
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8

AION: an atom interferometer observatory and network:

Badurina, L. ; Bentine, E. ; Blas, D....
Journal of Cosmology and Astroparticle Physics.  2020 (2020)  5 - p. 011-011 , 2020
 
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9

Thermochemical and Experimental Kinetic Analysis of Potassi..:

Haseli, P. ; Majewski, P. ; Christo, F. C...
Industrial & Engineering Chemistry Research.  58 (2019)  17 - p. 7397-7407 , 2019
 
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11

The DEPFET detector-amplifier structure for spectroscopic i..:

Lutz, G. ; Aschauer, S. ; Majewski, P...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment.  845 (2017)  - p. 122-127 , 2017
 
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12

First results on DEPFET Active Pixel Sensors fabricated in ..:

Aschauer, S. ; Majewski, P. ; Lutz, G....
Journal of Instrumentation.  12 (2017)  11 - p. P11013-P11013 , 2017
 
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13

Explicit "ballistic M-model": a refinement of the implicit ..:

Baranowski, L. ; Gadomski, B. ; Majewski, P..
Bulletin of the Polish Academy of Sciences Technical Sciences.  64 (2016)  1 - p. 81-89 , 2016
 
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14

Electrical characterization of different DEPFET designs on ..:

Bergbauer, B ; Aschauer, S ; Bähr, A...
Journal of Instrumentation.  9 (2014)  1 - p. C01020-C01020 , 2014
 
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15

Photosensitive oxide semiconductors for solar hydrogen fuel..:

Nowotny, J. ; Atanacio, A. J. ; Bak, T....
International Materials Reviews.  59 (2014)  8 - p. 449-478 , 2014
 
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