Majumdar, Kausik
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10

Electrically Self-Aligned, Reconfigurable Test Structure Us..:

Dasika, Pushkar ; Watanabe, Kenji ; Taniguchi, Takashi.
IEEE Transactions on Electron Devices.  69 (2022)  9 - p. 5377-5381 , 2022
 
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11

Integration of 3-Level MoS Multibridge Channel FET With 2D ..:

Hitesh, S. ; Dasika, Pushkar ; Watanabe, Kenji..
IEEE Electron Device Letters.  43 (2022)  11 - p. 1993-1996 , 2022
 
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15

Effect of nitrogen annealing on the optoelectronic properti..:

Ravindra, Pramod ; Chaudhary, Raghav ; Athresh, Eashwer...
Semiconductor Science and Technology.  36 (2021)  5 - p. 055016 , 2021
 
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