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2023 IEEE International Reliability Physics Symposium (IRPS) ,
4
Depassivation of Traps in the Polysilicon Channel of 3D NAN..:
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2023 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) ,
6
Understanding the impact of polysilicon percolative conduct..:
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2022 IEEE International Conference on Emerging Electronics (ICEE) ,
7
Recent Advances in the Understanding of Random Telegraph No..:
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Springer Handbook of Semiconductor Devices; Springer Handbooks ,
10
Memristive/CMOS Devices for Neuromorphic Applications:
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Special Topics in Information Technology; SpringerBriefs in Applied Sciences and Technology ,
11