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Mamy Randriamihaja, Yoann
7
results:
Search for persons
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Format
Online (7)
Mediatypes
Articles (Online) (5)
Bookchapter (Online) (1)
OpenAccess-fulltext (1)
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english (5)
french (1)
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?
1
Bias-Induced Healing of $V_{\text {min}}$ Failures in Advan..:
Mann, Randy W.
;
McMahon, William
;
Mamy Randriamihaja, Yoann
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25 (2017) 2 - p. 660-669 , 2017
Link:
https://doi.org/10.1109/..
?
2
Microscopic scale characterization and modeling of transist..:
Mamy Randriamihaja, Yoann
;
Huard, V.
;
Federspiel, X.
...
Microelectronics Reliability. 52 (2012) 11 - p. 2513-2520 , 2012
Link:
https://doi.org/10.1016/..
?
3
Comparing defect characterization techniques with non-radia..:
Garetto, Davide
;
Randriamihaja, Yoann Mamy
;
Rideau, Denis
..
Journal of Computational Electronics. 11 (2012) 3 - p. 225-237 , 2012
Link:
https://doi.org/10.1007/..
?
4
Analysis of defect capture cross sections using non-radiati..:
Garetto, Davide
;
Randriamihaja, Yoann Mamy
;
Zaka, Alban
...
Solid-State Electronics. 71 (2012) - p. 74-79 , 2012
Link:
https://doi.org/10.1016/..
?
5
Etude de la fiabilité des technologies CMOS avancées, depui..:
Mamy Randriamihaja, Yoann
http://www.theses.fr/2012AIXM4781/document. , 2012
Link:
http://www.theses.fr/201..
?
6
From defects creation to circuit reliability – A bottom-up ..:
Huard, V.
;
Cacho, F.
;
Mamy Randriamihaja, Y.
.
Microelectronic Engineering. 88 (2011) 7 - p. 1396-1407 , 2011
Link:
https://doi.org/10.1016/..
?
7
New Hot Carrier degradation modeling reconsidering the role..:
, In:
2013 IEEE International Reliability Physics Symposium (IRPS)
,
Randriamihaja, Y. Mamy
;
Federspiel, X.
;
Huard, V.
.. - p. XT.1.1-XT.1.5 , 2013
Link:
https://doi.org/10.1109/..
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