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Marca, Vincenzo Della
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1

A novel test structure with two active areas for eNVM relia..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
Alkema, Khaled ; Melul, Franck ; Marca, Vincenzo Della... - p. 1-5 , 2024
Link: https://doi.org/10.1109/..
 
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2

Real-time electrical measurements during laser attack on ST..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),
Yazigy, Nicole ; Postel-Pellerin, Jeremy ; Marca, Vincenzo Della... - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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3

SuperCAST: a full free addressable memory array:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
Marca, Vincenzo Della ; Guilleau-Tavernier, Julien ; Laine, Pierre... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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4

Morphology and reliability aspects of 40 nm eSTM™ architect..:

Melul, Franck ; Marca, Vincenzo Della ; Bocquet, Marc...
Microelectronics Reliability.  126 (2021)  - p. 114266 , 2021
Link: https://doi.org/10.1016/..
 
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5

True random number generation exploiting SET voltage variab..:

, In: 2019 19th Non-Volatile Memory Technology Symposium (NVMTS),
Postel-Pellerin, Jeremy ; Bazzi, Hussein ; Aziza, Hassen... - p. 1-5 , 2019
Link: https://doi.org/10.1109/..
 
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6

40nm SONOS Embedded Select in Trench Memory:

, In: ESSDERC 2023 - IEEE 53rd European Solid-State Device Research Conference (ESSDERC),
Habhab, Radouane ; Della Marca, Vincenzo ; Masson, Pascal... - p. 21-24 , 2023
Link: https://doi.org/10.1109/..
 
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7

TCAD investigation of zero-cost high voltage transistor arc..:

, In: 2019 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD),
Locati, Jordan ; Rivero, Christian ; Delalleau, Julien... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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8

Phenomenological modelling of non-volatile memory threshold..:

Chiquet, Philippe ; Chambonneau, Maxime ; Della Marca, Vincenzo...
Scientific Reports.  9 (2019)  1 - p. , 2019
Link: https://doi.org/10.1038/..
 
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9

Suppressing the memory state of floating gate transistors w..:

Chambonneau, Maxime ; Souiki-Figuigui, Sarra ; Chiquet, Philippe...
Applied Physics Letters.  110 (2017)  16 - p. , 2017
Link: https://doi.org/10.1063/..
 
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10

Improved Performance of Silicon Nanocrystal Memories for Ap..:

Della Marca, Vincenzo ; Amouroux, Julien ; Molas, Gabriel...
ECS Transactions.  53 (2013)  4 - p. 129-139 , 2013
Link: https://doi.org/10.1149/..
 
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11

Charge trapping in alumina and its impact on the operation ..:

Padovani, Andrea ; Larcher, Luca ; Della Marca, Vincenzo...
Journal of Applied Physics.  110 (2011)  1 - p. , 2011
Link: https://doi.org/10.1063/..
 
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12

Temperature effects on metal-alumina-nitride-oxide-silicon ..:

Padovani, Andrea ; Larcher, Luca ; Heh, Dawei...
Applied Physics Letters.  96 (2010)  22 - p. , 2010
Link: https://doi.org/10.1063/..
 
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13

SuperCAST: a full free addressable memory array:

Marca, Vincenzo Della ; Guilleau-Tavernier, Julien ; Laine, Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS50340.2022.9898189.  , 2022
Link: https://hal.science/hal-..
 
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14

SuperCAST: a full free addressable memory array:

Marca, Vincenzo Della ; Guilleau-Tavernier, Julien ; Laine, Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS50340.2022.9898189.  , 2022
Link: https://hal.science/hal-..
 
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15

SuperCAST: a full free addressable memory array:

Marca, Vincenzo Della ; Guilleau-Tavernier, Julien ; Laine, Pierre...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ICMTS50340.2022.9898189.  , 2022
Link: https://hal.science/hal-..
 
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