Marcuzzi, A.
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1

Threshold Voltage Drift and Recovery of SiC Trench MOSFETs ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Avramenko, M. ; De Schepper, L. ; Cano, J.-F.... - p. P54.SiC-1-P54.SiC-4 , 2024
 
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2

Review and Outlook on GaN and SiC Power Devices: Industrial..:

Buffolo, M. ; Favero, D. ; Marcuzzi, A....
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1344-1355 , 2024
 
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3

Origin and Recovery of Negative VTH Shift on 4H–SiC MOS Cap..:

Marcuzzi, A. ; Avramenko, M. ; De Santi, C....
Materials Science in Semiconductor Processing.  177 (2024)  - p. 108389 , 2024
 
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4

Charge Trapping in SiC MOSFETs under Constant Gate Current ..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),
Marcuzzi, A. ; Avramenko, M. ; De Santi, C.... - p. 1-5 , 2024
 
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5

Corrigendum to "Status of SPIDER beam source after the firs..:

Pavei, M. ; Gasparrini, C. ; Berton, G....
Fusion Engineering and Design.  196 (2023)  - p. 113989 , 2023
 
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6

Lifetime assessment of the modified grounded grid in the ne..:

Tomšič, P. ; Berton, G. ; Zaccaria, P....
Fusion Engineering and Design.  195 (2023)  - p. 113982 , 2023
 
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7

Lessons learned after three years of SPIDER operation and t..:

Marcuzzi, D. ; Toigo, V. ; Boldrin, M....
Fusion Engineering and Design.  191 (2023)  - p. 113590 , 2023
 
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8

Neonatal jaundice detection in low-income Mexican settings:..:

Jiménez-Díaz, G ; Keitsch, M ; Marcuzzi, A...
European Journal of Public Health.  33 (2023)  Supplement_2 - p. , 2023
 
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11

Status of SPIDER beam source after the first 3.5 years of o..:

Pavei, M. ; Gasparrini, C. ; Berton, G....
Fusion Engineering and Design.  192 (2023)  - p. 113831 , 2023
 
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12

GaN-on-Si Power HEMTs for Automotive: Current Status and Pe..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),
Favero, D. ; Marcuzzi, A. ; De Santi, C.... - p. 1-6 , 2023
 
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13

Isolation properties and failure mechanisms of vertical Pt ..:

Fregolent, M. ; Boito, M. ; Marcuzzi, A....
Microelectronics Reliability.  138 (2022)  - p. 114644 , 2022
 
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14

Strategy for Vacuum Insulation Tests of MITICA 1 MV Electro..:

Chitarin, G. ; Kojima, A. ; Boldrin, M....
IEEE Transactions on Plasma Science.  50 (2022)  9 - p. 2755-2762 , 2022
 
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15

Design of the new supporting structure for the passive stab..:

Berton, G. ; Bernardi, M. ; Dalla Palma, M....
Fusion Engineering and Design.  169 (2021)  - p. 112466 , 2021
 
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