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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
Threshold Voltage Drift and Recovery of SiC Trench MOSFETs ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
4
Charge Trapping in SiC MOSFETs under Constant Gate Current ..:
, In:
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2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
12