Margetis, Joe
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7

X-ray diffraction study of strain relaxation, spontaneous c..:

Stanchu, Hryhorii ; Kuchuk, Andrian V ; Mazur, Yuriy I...
Semiconductor Science and Technology.  35 (2020)  7 - p. 075009 , 2020
 
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9

Development of SiGeSn Technique towards Integrated Mid-Infr..:

, In: 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and Technology Symposium (BCICTS),
 
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13

Study of High Performance GeSn Photodetectors with Cutoff W..:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),
Tran, Huong ; Pham, Thach ; Margetis, Joe... - p. 1-2 , 2019
 
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15

Si-Based Mid-Infrared GeSn-Edge-Emitting Laser with Operati..:

, In: 2019 Conference on Lasers and Electro-Optics (CLEO),
Zhou, Yiyin ; Dou, Wei ; Du, Wei... - p. 1-2 , 2019
 
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