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Mariniello, Genaro
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1

Electrical characteristics of n-type vertically stacked nan..:

Mariniello, Genaro ; Barraud, Sylvain ; Vinet, Maud...
Solid-State Electronics.  194 (2022)  - p. 108337 , 2022
Link: https://doi.org/10.1016/..
 
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2

An Experimental Evaluation of Fin Width and Low-Temperature..:

, In: 2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE),
de Souza, Michelly ; Rodrigues, Jaime Calcade ; Mariniello, Genaro... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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3

Electrical characterization of stacked SOI nanowires at low..:

Rodrigues, Jaime C. ; Mariniello, Genaro ; Cassé, Mikael...
Solid-State Electronics.  191 (2022)  - p. 108260 , 2022
Link: https://doi.org/10.1016/..
 
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4

Performance of Stacked SOI Nanowires in a Wide Temperature ..:

, In: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS),
Rodrigues, Jaime C. ; Mariniello, Genaro ; Casse, Mikael... - p. 1-4 , 2021
Link: https://doi.org/10.1109/..
 
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5

Analog characteristics of n-type vertically stacked nanowir..:

Mariniello, Genaro ; Carvalho, Cesar Augusto Belchior de ; Cardoso Paz, Bruna...
Solid-State Electronics.  185 (2021)  - p. 108127 , 2021
Link: https://doi.org/10.1016/..
 
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6

Experimental Analysis of Self-Heating Effects Using the Pul..:

, In: 2018 33rd Symposium on Microelectronics Technology and Devices (SBMicro),
Bergamaschi, Flavio Enrico ; Mariniello, Genaro ; Barraud, Sylvain. - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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7

Simulation Comparison of Self-Heating Effects in Junctionle..:

Mariniello, Genaro ; Pavanello, Marcelo
ECS Transactions.  66 (2015)  1 - p. 259-266 , 2015
Link: https://doi.org/10.1149/..
 
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8

Performance and Analysis of n-Type Vertically Stacked Nanow..:

Carvalho, Cesar Augusto Belchior ; Mariniello da Silva, Genaro ; Paz, Bruna Cardoso...
Journal of Integrated Circuits and Systems.  15 (2020)  2 - p. 1-5 , 2020
Link: https://doi.org/10.29292..
 
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9

Modeling of silicon stacked nanowire and nanosheet transist..:

, In: 2022 IEEE Latin American Electron Devices Conference (LAEDC),
Cerdeira, Antonio ; Estrada, Magali ; Da Silva, Genaro Mariniello.. - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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