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2024 IEEE European Test Symposium (ETS) ,
1
Design-for-Test for Intermittent Faults in STT-MRAMs:
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2024 IEEE 42nd VLSI Test Symposium (VTS) ,
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IEEE Std P3405: New Standard-under-Development for Chiplet ..:
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2024 IEEE European Test Symposium (ETS) ,
4
Silent Data Corruption: Test or Reliability Problem?:
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2024 IEEE European Test Symposium (ETS) ,
5
New Standard-under-Development for Chiplet Interconnect Tes..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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Effective and Efficient Testing of Large Numbers of Inter-D..:
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2023 IEEE International Test Conference in Asia (ITC-Asia) ,
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Generating Test Patterns for Chiplet Interconnects: Achievi..:
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2023 IEEE 41st VLSI Test Symposium (VTS) ,
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IP Session on Chiplet: Design, Assembly, and Test:
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2023 IEEE International Test Conference (ITC) ,
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Wafer-Scale Electrical Characterization of Silicon Quantum ..:
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2023 IEEE 32nd Asian Test Symposium (ATS) ,
10
Device Aware Diagnosis for Unique Defects in STT-MRAMs:
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2023 IEEE International 3D Systems Integration Conference (3DIC) ,
11
Effective and Efficient Test and Diagnosis Pattern Generati..:
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2023 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
12
Device-Aware Test for Back-Hopping Defects in STT-MRAMs:
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2023 IEEE International Test Conference in Asia (ITC-Asia) ,
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