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Markunas, J.K.
58
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Online (58)
Mediatypes
Articles (Online) (37)
OpenAccess-fulltext (21)
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1
Impact of CdZnTe Substrates on MBE HgCdTe Deposition:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 46 (2017) 9 - p. 5418-5423 , 2017
Link:
https://doi.org/10.1007/..
?
2
Analysis of Etched CdZnTe Substrates:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 45 (2016) 9 - p. 4502-4510 , 2016
Link:
https://doi.org/10.1007/..
?
3
As-Received CdZnTe Substrate Contamination:
Benson, J. D.
;
Bubulac, L. O.
;
Jaime-Vasquez, M.
...
Journal of Electronic Materials. 44 (2015) 9 - p. 3082-3091 , 2015
Link:
https://doi.org/10.1007/..
?
4
Impact of Tellurium Precipitates in CdZnTe Substrates on MB..:
Benson, J. D.
;
Bubulac, L. O.
;
Smith, P. J.
...
Journal of Electronic Materials. 43 (2014) 11 - p. 3993-3998 , 2014
Link:
https://doi.org/10.1007/..
?
5
The Surface Kinetics of MBE-Grown CdTe (211)B During In Sit..:
Lennon, C. M.
;
Almeida, L. A.
;
Jacobs, R. N.
...
Journal of Electronic Materials. 42 (2013) 11 - p. 3344-3348 , 2013
Link:
https://doi.org/10.1007/..
?
6
Impurity Gettering in (112)B HgCdTe/CdTe/Alternate Substrat..:
Benson, J. D.
;
Bubulac, L. O.
;
Lennon, C. M.
...
Journal of Electronic Materials. 42 (2013) 11 - p. 3217-3223 , 2013
Link:
https://doi.org/10.1007/..
?
7
Real-Time In Situ Monitoring of GaAs (211) Oxide Desorption..:
Lennon, C.M.
;
Almeida, L.A.
;
Jacobs, R.N.
...
Journal of Electronic Materials. 41 (2012) 10 - p. 2965-2970 , 2012
Link:
https://doi.org/10.1007/..
?
8
Development of MBE II–VI Epilayers on GaAs(211)B:
Jacobs, R.N.
;
Nozaki, C.
;
Almeida, L.A.
...
Journal of Electronic Materials. 41 (2012) 10 - p. 2707-2713 , 2012
Link:
https://doi.org/10.1007/..
?
9
Growth and Analysis of HgCdTe on Alternate Substrates:
Benson, J.D.
;
Bubulac, L.O.
;
Smith, P.J.
...
Journal of Electronic Materials. 41 (2012) 10 - p. 2971-2974 , 2012
Link:
https://doi.org/10.1007/..
?
10
High-Quality (211)B CdTe on (211)Si Substrates Using Metalo..:
Rao, S. R.
;
Shintri, S. S.
;
Markunas, J. K.
..
Journal of Electronic Materials. 40 (2011) 8 - p. 1790-1794 , 2011
Link:
https://doi.org/10.1007/..
?
11
Dislocation Analysis in (112)B HgCdTe/CdTe/Si:
Benson, J. D.
;
Farrell, S.
;
Brill, G.
...
Journal of Electronic Materials. 40 (2011) 8 - p. 1847-1853 , 2011
Link:
https://doi.org/10.1007/..
?
12
Si Wafer Thinning Techniques Compatible With Epitaxy of CdT..:
Markunas, J. K.
;
Jacobs, R. N.
;
Smith, P. J.
.
Journal of Electronic Materials. 40 (2011) 8 - p. 1809-1814 , 2011
Link:
https://doi.org/10.1007/..
?
13
Cyclic Annealing During Metalorganic Vapor-Phase Epitaxial ..:
Rao, S. R.
;
Shintri, S. S.
;
Markunas, J. K.
..
Journal of Electronic Materials. 39 (2010) 7 - p. 996-1000 , 2010
Link:
https://doi.org/10.1007/..
?
14
Feasibility of Localized Substrate Thinning for Reduced Dis..:
Jacobs, R. N.
;
Smith, P. J.
;
Markunas, J. K.
..
Journal of Electronic Materials. 39 (2010) 7 - p. 1036-1042 , 2010
Link:
https://doi.org/10.1007/..
?
15
Characterization of Dislocations in (112)B HgCdTe/CdTe/Si:
Benson, J. D.
;
Bubulac, L. O.
;
Smith, P. J.
...
Journal of Electronic Materials. 39 (2010) 7 - p. 1080-1086 , 2010
Link:
https://doi.org/10.1007/..
1-15