Search for persons
X
?
2023 IEEE International Reliability Physics Symposium (IRPS) ,
1
Challenges and solutions to the defect-centric modeling and..:
, In:
?
2022 IEEE International Symposium on Circuits and Systems (ISCAS) ,
2
Beneficial Role of Noise in Hf-based Memristors:
, In:
?
2022 IEEE 22nd International Conference on Nanotechnology (NANO) ,
3
Stochastic resonance effect in binary STDP performed by RRA..:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
7
Experimental Monitoring of Aging in CMOS RF Linear Power Am..:
, In:
?
2019 26th IEEE International Conference on Electronics, Circuits and Systems (ICECS) ,
9
Noise-induced Performance Enhancement of Variability-aware ..:
, In:
?
Proceedings of the 53rd Annual Design Automation Conference ,
14