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Matana Luza, Lucas
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1

Neutron-induced effects on a self-refresh DRAM:

Matana Luza, Lucas ; Söderström, Daniel ; Puchner, Helmut...
Microelectronics Reliability.  128 (2022)  - p. 114406 , 2022
Link: https://doi.org/10.1016/..
 
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2

A Survey on Deep Learning Resilience Assessment Methodologi..:

Ruospo, Annachiara ; Sanchez, Ernesto ; Luza, Lucas Matana...
Computer.  56 (2023)  2 - p. 57-66 , 2023
Link: https://doi.org/10.1109/..
 
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3

Technology Dependence of Stuck Bits and Single-Event Upsets..:

Söderström, Daniel ; Luza, Lucas Matana ; de Mattos, André Martins Pio...
IEEE Transactions on Nuclear Science.  70 (2023)  8 - p. 1861-1869 , 2023
Link: https://doi.org/10.1109/..
 
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4

Emulating the Effects of Radiation-Induced Soft-Errors for ..:

Luza, Lucas Matana ; Ruospo, Annachiara ; Soderstrom, Daniel...
IEEE Transactions on Emerging Topics in Computing.  10 (2022)  4 - p. 1867-1882 , 2022
Link: https://doi.org/10.1109/..
 
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5

Impact of Atmospheric and Space Radiation on Sensitive Elec..:

, In: 2022 IEEE European Test Symposium (ETS),
Luza, Lucas Matana ; Wrobel, Frederic ; Entrena, Luis. - p. 1-10 , 2022
Link: https://doi.org/10.1109/..
 
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6

Reliability analysis of a fault-tolerant RISC-V system-on-c..:

Santos, Douglas Almeida ; Luza, Lucas Matana ; Dilillo, Luigi..
Microelectronics Reliability.  125 (2021)  - p. 114346 , 2021
Link: https://doi.org/10.1016/..
 
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7

Technology Impact on Neutron-Induced Effects in SDRAMs: A C..:

, In: 2021 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
Luza, Lucas Matana ; Soderstrom, Daniel ; Pio de Mattos, Andre Martins... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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8

Pros and Cons of Fault Injection Approaches for the Reliabi..:

, In: 2021 IEEE 22nd Latin American Test Symposium (LATS),
Ruospo, Annachiara ; Luza, Lucas Matana ; Bosio, Alberto... - p. 1-5 , 2021
Link: https://doi.org/10.1109/..
 
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9

A Low-Cost Fault-Tolerant RISC-V Processor for Space System:

, In: 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
Santos, Douglas Almeida ; Luza, Lucas Matana ; Zeferino, Cesar Albenes.. - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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10

Effects of Thermal Neutron Irradiation on a Self-Refresh DR..:

, In: 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS),
Luza, Lucas Matana ; Soderstrom, Daniel ; Puchner, Helmut... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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11

Investigating the Impact of Radiation-Induced Soft Errors o..:

, In: 2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Luza, Lucas Matana ; Soderstrom, Daniel ; Tsiligiannis, Georgios... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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12

Effects of Heavy Ion and Proton Irradiation on a SLC NAND F..:

, In: 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Luza, Lucas Matana ; Bosser, Alexandre ; Gupta, Viyas... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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13

Stuck and Weakened Bits in SDRAM from a Heavy-Ion Microbeam:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Soderstrom, Daniel ; Luza, Lucas Matana ; Bosser, Alexandre... - p. 1-6 , 2019
Link: https://doi.org/10.1109/..
 
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14

Technology Dependence of Stuck Bits and Single Event Upsets..:

Söderström, Daniel ; Matana Luza, Lucas ; Martins Pio De Mattos, André...
IEEE Transactions on Nuclear Science.  , 2023
Link: http://urn.fi/URN:NBN:fi..
 
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15

A Survey on Deep Learning Resilience Assessment Methodologi..:

Ruospo, Annachiara ; Sanchez, Ernesto ; Matana Luza, Lucas...
info:eu-repo/semantics/altIdentifier/doi/10.1109/MC.2022.3217841.  , 2023
Link: https://hal-lirmm.ccsd.c..
 
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