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Matsuda, Asahiko
21  results:
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1

NF3 and F2 gas fluorination of GaN surface and Pt/GaN inter..:

Matsuda, Asahiko ; Teramoto, Takashi ; Nagata, Takahiro...
Applied Surface Science.  659 (2024)  - p. 159941 , 2024
Link: https://doi.org/10.1016/..
 
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2

Integration of X-ray absorption fine structure databases fo..:

Ishii, Masashi ; Tanabe, Kosuke ; Matsuda, Asahiko...
Science and Technology of Advanced Materials: Methods.  3 (2023)  1 - p. , 2023
Link: https://doi.org/10.1080/..
 
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3

Wide band gap kesterite absorbers for thin film solar cells..:

Vermang, Bart ; Brammertz, Guy ; Meuris, Marc...
Sustainable Energy & Fuels.  3 (2019)  9 - p. 2246-2259 , 2019
Link: https://doi.org/10.1039/..
 
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4

Materials Data Platform - a FAIR System for Data-Driven Mat..:

, In: 2019 8th International Congress on Advanced Applied Informatics (IIAI-AAI),
Tanifuji, Mikiko ; Matsuda, Asahiko ; Yoshikawa, Hideki - p. 1021-1022 , 2019
Link: https://doi.org/10.1109/..
 
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5

Chemical Synthesis of Multilayered Nanostructured Perovskit..:

Zakaria, Mohamed Barakat ; Nagata, Takahiro ; Matsuda, Asahiko...
ACS Applied Nano Materials.  1 (2018)  2 - p. 915-921 , 2018
Link: https://doi.org/10.1021/..
 
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6

Micro-photoreflectance spectroscopy for microscale monitori..:

Matsuda, Asahiko ; Nakakubo, Yoshinori ; Takao, Yoshinori..
Japanese Journal of Applied Physics.  53 (2014)  3S2 - p. 03DF01 , 2014
Link: https://doi.org/10.7567/..
 
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7

Effects of straggling of incident ions on plasma-induced da..:

Eriguchi, Koji ; Matsuda, Asahiko ; Takao, Yoshinori.
Japanese Journal of Applied Physics.  53 (2014)  3S2 - p. 03DE02 , 2014
Link: https://doi.org/10.7567/..
 
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8

Trade-Off Relationship between Si Recess and Defect Density..:

Eriguchi, Koji ; Nakakubo, Yoshinori ; Matsuda, Asahiko...
Japanese Journal of Applied Physics.  50 (2011)  8S2 - p. 08KD04 , 2011
Link: https://doi.org/10.7567/..
 
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9

Advanced Contactless Analysis of Plasma-Induced Damage on S..:

Matsuda, Asahiko ; Nakakubo, Yoshinori ; Takao, Yoshinori..
Japanese Journal of Applied Physics.  50 (2011)  8S2 - p. 08KD03 , 2011
Link: https://doi.org/10.1143/..
 
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10

Advanced Contactless Analysis of Plasma-Induced Damage on S..:

Matsuda, Asahiko ; Nakakubo, Yoshinori ; Takao, Yoshinori..
Japanese Journal of Applied Physics.  50 (2011)  8S2 - p. 08KD03 , 2011
Link: https://doi.org/10.7567/..
 
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11

Trade-Off Relationship between Si Recess and Defect Density..:

Eriguchi, Koji ; Nakakubo, Yoshinori ; Matsuda, Asahiko...
Japanese Journal of Applied Physics.  50 (2011)  8S2 - p. 08KD04 , 2011
Link: https://doi.org/10.1143/..
 
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12

Threshold Voltage Instability Induced by Plasma Process Dam..:

Eriguchi, Koji ; Nakakubo, Yoshinori ; Matsuda, Asahiko...
Japanese Journal of Applied Physics.  49 (2010)  8S1 - p. 08JC02 , 2010
Link: https://doi.org/10.1143/..
 
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13

Model for Bias Frequency Effects on Plasma-Damaged Layer Fo..:

Eriguchi, Koji ; Nakakubo, Yoshinori ; Matsuda, Asahiko..
Japanese Journal of Applied Physics.  49 (2010)  5R - p. 056203 , 2010
Link: https://doi.org/10.1143/..
 
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14

Comprehensive Modeling of Threshold Voltage Variability Ind..:

Eriguchi, Koji ; Nakakubo, Yoshinori ; Matsuda, Asahiko...
Japanese Journal of Applied Physics.  49 (2010)  4S - p. 04DA18 , 2010
Link: https://doi.org/10.1143/..
 
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15

Optical and Electrical Characterization of Hydrogen-Plasma-..:

Nakakubo, Yoshinori ; Matsuda, Asahiko ; Fukasawa, Masanaga...
Japanese Journal of Applied Physics.  49 (2010)  8S1 - p. 08JD02 , 2010
Link: https://doi.org/10.1143/..
 
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