Matsushige, Kazumi
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2

Using dynamic force microscopy with piezoelectric cantileve..:

Satoh, Nobuo ; Nakahara, Masayuki ; Kobayashi, Kei...
Nonlinear Theory and Its Applications, IEICE.  8 (2017)  2 - p. 98-106 , 2017
 
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3

Near-field light detection of a photo induced force by atom..:

Satoh, Nobuo ; Kobayashi, Kei ; Matsushige, Kazumi.
Japanese Journal of Applied Physics.  56 (2017)  8S1 - p. 08LB03 , 2017
 
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4

Optical and mechanical detection of near-field light by ato..:

Satoh, Nobuo ; Kobayashi, Kei ; Watanabe, Shunji...
Japanese Journal of Applied Physics.  55 (2016)  8S1 - p. 08NB04 , 2016
 
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5

Twin‐Probe Atomic Force Microscopy with Optical Beam Deflec..:

SATOH, NOBUO ; TSUNEMI, EIKA ; KOBAYASHI, KEI...
Electronics and Communications in Japan.  99 (2016)  9 - p. 92-100 , 2016
 
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6

Surface potential measurement of fullerene derivative/coppe..:

Satoh, Nobuo ; Yamaki, Michio ; Noda, Kei...
Japanese Journal of Applied Physics.  54 (2015)  8S1 - p. 08KF06 , 2015
 
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7

Surface Potential Investigation of Fullerene Derivative Fil..:

Satoh, Nobuo ; Katori, Shigetaka ; Kobayashi, Kei...
e-Journal of Surface Science and Nanotechnology.  13 (2015)  0 - p. 102-106 , 2015
 
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8

Surface Potential Measurement of Organic Multi-layered Film..:

SATOH, Nobuo ; KATORI, Shigetaka ; KOBAYASHI, Kei..
IEICE Transactions on Electronics.  E98.C (2015)  2 - p. 91-97 , 2015
 
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10

Scanning near-field optical microscopy system based on freq..:

Satoh, Nobuo ; Kobayashi, Kei ; Watanabe, Shunji...
Japanese Journal of Applied Physics.  53 (2014)  12 - p. 125201 , 2014
 
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13

Surface potential measurement of fullerene/copper phthalocy..:

Satoh, Nobuo ; Katori, Shigetaka ; Kobayashi, Kei..
Japanese Journal of Applied Physics.  53 (2014)  5S1 - p. 05FY03 , 2014
 
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