E-LIB Suche - Ergebnisse für: Matteo Buffolo

1

Investigation of degradation dynamics of 265 nm LEDs assist..:

Piva, Francesco ; Buffolo, Matteo ; Roccato, Nicola...
Semiconductor Science and Technology. 39 (2024) 7 - p. 075025 , 2024

Link: https://doi.org/10.1088/..

2

TCAD Modeling and Simulation of Dark Current-Voltage Charac..:

Nicoletto, Marco ; Caria, Alessandro ; De Santi, Carlo...
IEEE Journal of Photovoltaics. 14 (2024) 3 - p. 450-458 , 2024

Link: https://doi.org/10.1109/..

3

Guest Editorial: Special Issue on Wide and Ultrawide Band G..:

Meneghini, Matteo ; Ng, Geok Ing ; Medjdoub, Farid...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1340-1343 , 2024

Link: https://doi.org/10.1109/..

4

Fast Characterization of Power LEDs: Circuit Design and Exp..:

Roccato, Nicola ; Piva, Francesco ; Buffolo, Matteo...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3753-3760 , 2024

Link: https://doi.org/10.1109/..

5

Modeling of the Electrical Characteristics and Degradation ..:

Roccato, Nicola ; Piva, Francesco ; De Santi, Carlo...
IEEE Photonics Journal. 16 (2024) 1 - p. 1-6 , 2024

Link: https://doi.org/10.1109/..

6

Advanced defect spectroscopy in wide-bandgap semiconductors..:

Fregolent, Manuel ; Piva, Francesco ; Buffolo, Matteo...
Journal of Physics D: Applied Physics. 57 (2024) 43 - p. 433002 , 2024

Link: https://doi.org/10.1088/..

7

Investigation and modeling of the role of interface defects..:

Roccato, Nicola ; Piva, Francesco ; Buffolo, Matteo...
Journal of Physics D: Applied Physics. , 2024

Link: https://doi.org/10.1088/..

8

Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:

Zanoni, Enrico ; De Santi, Carlo ; Gao, Zhan...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1396-1407 , 2024

Link: https://doi.org/10.1109/..

9

Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon ..:

Zenari, Michele ; Gioannini, Mariangela ; Buffolo, Matteo...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024

Link: https://doi.org/10.1109/..

10

Impact of the oxide aperture width on the degradation of 84..:

Zenari, Michele ; Buffolo, Matteo ; Rampazzo, Fabiana...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024

Link: https://doi.org/10.1109/..

11

Modeling the Electrical Degradation of Micro-transfer-Print..:

Zenari, Michele ; Buffolo, Matteo ; De Santi, Carlo...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 1131-1138 , 2024

Link: https://doi.org/10.1109/..

12

V-Pits and Trench-Like Defects in High Periodicity MQWs GaN..:

Nicoletto, Marco ; Caria, Alessandro ; Rampazzo, Fabiana...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2051-2057 , 2024

Link: https://doi.org/10.1109/..

13

Performance and Degradation of Commercial Ultraviolet‐C Lig..:

Trivellin, Nicola ; Piva, Francesco ; Fiorimonte, Davide...
physica status solidi (a). , 2023

Link: https://doi.org/10.1002/..

14

Solid State Lighting for horticolture: impact of LED reliab..:

, In: 2023 IEEE Sustainable Smart Lighting World Conference & Expo (LS18),

Trivellin, Nicola ; Buffolo, Matteo ; Caria, Alessandro... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

15

Optoelectronic technologies for lighting in automotive: sta..:

, In: 2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE),

Trivellin, Nicola ; Buffolo, Matteo ; De Santi, Carlo... - p. 1-6 , 2023

Link: https://doi.org/10.23919..