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2019 21st European Conference on Power Electronics and Applications (EPE '19 ECCE Europe) ,
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SiC Diode Characterization using Pulsed S-Parameter Measure..:
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IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society ,
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Characterization of Parasitic Elements in Capacitors for Fa..:
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2019 IEEE 2nd 5G World Forum (5GWF) ,
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