E-LIB Suche - Ergebnisse für: McAndrew, Colin C.

1

A Step-by-Step Layout Transformation Approach to Differenti..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),

Lu, Luke ; Xia, Kejun ; van Langevelde, Ronald.. - p. 1-5 , 2024

Link: https://doi.org/10.1109/..

2

Accurate Gate Charge Modeling of HV LDMOS Transistors for P..:

, In: 2023 35th International Conference on Microelectronic Test Structure (ICMTS),

Jie, Xiaorui ; Langevelde, Ronald van ; Xia, Kejun... - p. 1-5 , 2023

Link: https://doi.org/10.1109/..

3

Improvements to Statistical Characterization and Modeling, ..:

McAndrew, Colin C. ; Hoseini, Mariam ; Braswell, Brandt.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 42 (2023) 7 - p. 2252-2263 , 2023

Link: https://doi.org/10.1109/..

4

The Evolution of Transistor Models: Always trying to keep u..:

Nagel, Laurence W. ; McAndrew, Colin C.
IEEE Solid-State Circuits Magazine. 15 (2023) 3 - p. 29-35 , 2023

Link: https://doi.org/10.1109/..

5

Parameter Extraction for the PSPHV LDMOS Transistor Model:

Xia, Kejun ; McAndrew, Colin C. ; Van Langevelde, Ronald
IEEE Journal of the Electron Devices Society. 8 (2020) - p. 813-824 , 2020

Link: https://doi.org/10.1109/..

6

How Come SPICE Is a Verb?: The Natural Course of a Diverse ..:

Mcandrew, Colin C.
IEEE Solid-State Circuits Magazine. 11 (2019) 1 - p. 14-18 , 2019

Link: https://doi.org/10.1109/..

7

Corner models: Inaccurate at best, and it only gets worst …:

, In: Proceedings of the IEEE 2013 Custom Integrated Circuits Conference,

McAndrew, Colin C. ; Lim, Ik-Sung ; Braswell, Brandt. - p. 1-4 , 2013

Link: https://doi.org/10.1109/..

8

Compact model and circuit simulations for asymmetric, indep..:

Dessai, Gajanan ; Wu, Weimin ; Bakkaloglu, Bertan..
Journal of Computational Electronics. 9 (2010) 3-4 - p. 103-107 , 2010

Link: https://doi.org/10.1007/..

9

Extensions to Backward Propagation of Variance for Statisti..:

McAndrew, Colin C. ; Li, Xin ; Stevanovic, Ivica.
IEEE Design & Test of Computers. 27 (2010) 2 - p. 36-43 , 2010

Link: https://doi.org/10.1109/..

10

Statistical modeling of inter-device correlations with BPV:

Stevanović, Ivica ; Li, Xin ; McAndrew, Colin C...
Solid-State Electronics. 54 (2010) 8 - p. 796-800 , 2010

Link: https://doi.org/10.1016/..

11

A three-dimensional, physically based compact model for IC ..:

Victory, James ; McAndrew, Colin C. ; Thoma, Rainer
Microelectronics Journal. 29 (1998) 7 - p. 451-459 , 1998

Link: https://doi.org/10.1016/..

12

Technology CAD at AT&T:

Lloyd, Peter ; McAndrew, Colin C. ; McLennan, Michael J....
Microelectronics Journal. 26 (1995) 2-3 - p. 79-97 , 1995

Link: https://doi.org/10.1016/..

13

MOSFET effective channel width determination by nonlinear o..:

McAndrew, Colin C. ; Layman, Paul A. ; Ashton, Robert A.
Solid-State Electronics. 36 (1993) 12 - p. 1717-1723 , 1993

Link: https://doi.org/10.1016/..

14

Parameter Extraction for the PSPHV LDMOS Transistor Model:

Kejun Xia ; Colin C. McAndrew ; Ronald Van Langevelde
https://ieeexplore.ieee.org/document/9146541/. , 2020

Link: https://doi.org/10.1109/..

15

Physical and Numerically Stable Linvill-Lump Compact Model ..:

Marcel N. Tutt ; Colin C. McAndrew
https://ieeexplore.ieee.org/document/7378825/. , 2016

Link: https://doi.org/10.1109/..