McLarty, P. K.
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1

Electrical and reliability properties of thin silicon oxini..:

Morfouli, P ; Ghibaudo, G ; Vogel, E.M...
Solid-State Electronics.  41 (1997)  7 - p. 1051-1055 , 1997
 
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2

N-channel and p-channel MOSFETs with oxynitride gate dielec..:

Hill, W.L. ; Vogel, E. ; McLarty, P.K....
Microelectronic Engineering.  28 (1995)  1-4 - p. 269-272 , 1995
 
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Characterization of Thin Silicon Oxynitride Films Prepared ..:

Xu, X. ‐L. ; McLarty, P. K. ; Brush, H....
Journal of The Electrochemical Society.  140 (1993)  10 - p. 2970-2974 , 1993
 
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8

Thin oxynitride film metal-oxide-semiconductor transistors ..:

McLarty, P. K. ; Hill, W. L. ; Xu, X.-L....
Applied Physics Letters.  63 (1993)  26 - p. 3619-3621 , 1993
 
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11

Recombination in solar-grade polycrystalline silicon:

McLarty, P. K. ; Ioannou, D. E. ; Shea, S. P.
Journal of Applied Physics.  61 (1987)  7 - p. 2672-2674 , 1987
 
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13

On the Barrier Height of Al/p-Si Schottky Diodes:

Ioannou, D. E. ; Huang, Y. J. ; McLarty, P. K..
physica status solidi (a).  93 (1986)  2 - p. K223-K226 , 1986
 
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15

Low Prevalence of Risk Factors for Coronary Heart Disease i..:

SWAI, ANDREW B M ; MCLARTY, DONALD G ; KITANGE, HENRY M...
International Journal of Epidemiology.  22 (1993)  4 - p. 651-659 , 1993
 
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