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Medeiros, Guilherme Cardoso
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1

Defects, Fault Modeling, and Test Development Framework for..:

Fieback, Moritz ; Medeiros, Guilherme Cardoso ; Wu, Lizhou...
ACM Journal on Emerging Technologies in Computing Systems.  18 (2022)  3 - p. 1-26 , 2022
Link: https://doi.org/10.1145/..
 
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2

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-..:

, In: 2022 IEEE European Test Symposium (ETS),
Fieback, Moritz ; Munch, Christopher ; Gebregiorgis, Anteneh... - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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3

Defect and Fault Modeling Framework for STT-MRAM Testing:

Wu, Lizhou ; Rao, Siddharth ; Taouil, Mottaqiallah...
IEEE Transactions on Emerging Topics in Computing.  9 (2021)  2 - p. 707-723 , 2021
Link: https://doi.org/10.1109/..
 
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4

Modeling Soft-Error Reliability Under Variability:

, In: 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Balakrishnan, Aneesh ; Medeiros, Guilherme Cardoso ; Gursoy, Cemil Cem... - p. 1-6 , 2021
Link: https://doi.org/10.1109/..
 
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5

A DFT Scheme to Improve Coverage of Hard-to-Detect Faults i..:

, In: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Medeiros, Guilherme Cardoso ; Cem Gursoy, Cemil ; Wu, Lizhou... - p. 792-797 , 2020
Link: https://doi.org/10.23919..
 
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6

A DFT scheme to improve coverage of hard-to-detect faults i..:

, In: Proceedings of the 23rd Conference on Design, Automation and Test in Europe,
Medeiros, Guilherme Cardoso ; Gürsoy, Cemil Cem ; Wu, Lizhou... - p. 792-797 , 2020
Link: https://dl.acm.org/doi/1..
 
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7

Evaluating the Impact of Ionizing Particles on FinFET -base..:

, In: 2020 IEEE Latin-American Test Symposium (LATS),
Copetti, Thiago ; Medeiros, Guilherme Cardoso ; Taouil, Mottaqiallah... - p. 1-6 , 2020
Link: https://doi.org/10.1109/..
 
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8

Device-Aware Test: A New Test Approach Towards DPPB Level:

, In: 2019 IEEE International Test Conference (ITC),
Fieback, Moritz ; Wu, Lizhou ; Medeiros, Guilherme Cardoso... - p. 1-10 , 2019
Link: https://doi.org/10.1109/..
 
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9

Identification and Rejuvenation of NBTI-Critical Logic Path..:

Jenihhin, Maksim ; Squillero, Giovanni ; Copetti, Thiago Santos...
Journal of Electronic Testing.  32 (2016)  3 - p. 273-289 , 2016
Link: https://doi.org/10.1007/..
 
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10

Hard-to-Detect Fault Analysis in FinFET SRAMs:

Cardoso Medeiros, Guilherme ; Fieback, Moritz ; Wu, Lizhou...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  29 (2021)  6 - p. 1271-1284 , 2021
Link: https://doi.org/10.1109/..
 
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11

Evaluation of Single Event Upset Susceptibility of FinFET-b..:

Copetti, Thiago ; Cardoso Medeiros, Guilherme ; Taouil, Mottaqiallah...
Journal of Electronic Testing.  37 (2021)  3 - p. 383-394 , 2021
Link: https://doi.org/10.1007/..
 
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12

PVT Analysis for RRAM and STT-MRAM-based Logic Computation-..:

Fieback, Moritz ; Münch, Christopher ; Gebregiorgis, Anteneh...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ETS54262.2022.9810436.  , 2022
Link: https://publikationen.bi..
 
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13

Evaluation of single event upset susceptibility of FinFET-b..:

Copetti, Thiago Santos ; Medeiros, Guilherme Cardoso ; Taouil, Mottaqiallah...
Journal of electronic testing : theory and applications. Dordrecht : Kluwer. Vol. 37 (2021), p. 383-394.  , 2021
Link: http://hdl.handle.net/10..
 
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14

Intermittent Undefined State Fault in RRAMs:

Fieback, Moritz ; Medeiros, Guilherme Cardoso ; Gebregiorgis, Anteneh...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ETS50041.2021.9465401.  , 2021
Link: https://hal.science/hal-..
 
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15

Intermittent Undefined State Fault in RRAMs:

Fieback, Moritz ; Medeiros, Guilherme Cardoso ; Gebregiorgis, Anteneh...
info:eu-repo/semantics/altIdentifier/doi/10.1109/ETS50041.2021.9465401.  , 2021
Link: https://hal.science/hal-..
 
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