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Medina, Nilberto H.
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1

Heavy Ion-Induced Faults on Programmable UART Controllers E..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Costa, Victor O. ; Benevenuti, Fabio ; Menezes, Renan... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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2

Reliability Assessment of Arm Cortex-M Processors under Hea..:

, In: 2024 IEEE 25th Latin American Test Symposium (LATS),
Gobatto, Leonardo R. ; Benevenuti, Fabio ; Added, Nemitala... - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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3

Evaluating the Reliability of Different Voting Schemes for ..:

Balen, Tiago R. ; González, Carlos J. ; Oliveira, Ingrid F. V....
Journal of Electronic Testing.  39 (2023)  4 - p. 409-420 , 2023
Link: https://doi.org/10.1007/..
 
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4

Unsupervised machine learning application to identify singl..:

Allegro, Paula R.P. ; Toufen, Dennis L. ; Aguiar, Vitor A.P....
Microelectronics Reliability.  142 (2023)  - p. 114916 , 2023
Link: https://doi.org/10.1016/..
 
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5

Alpha Particle- and Neutron-Induced Single-Event Effects in..:

, In: 2022 22nd European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Alberton, Saulo G. ; Boas, Alexis C. V. ; Medina, Nilberto H.... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
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6

Initial State Interaction for the 20Ne + 130Te and 18O + 11..:

Carbone, Diana ; Linares, Roberto ; Amador-Valenzuela, Paulina...
Universe.  7 (2021)  3 - p. 58 , 2021
Link: https://doi.org/10.3390/..
 
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7

Testing a Fault Tolerant Mixed-Signal Design Under TID and ..:

Gonzalez, Carlos J ; Machado, Diego ; Vaz, Rafael G...
Journal of Integrated Circuits and Systems.  16 (2021)  3 - p. 1-11 , 2021
Link: https://doi.org/10.29292..
 
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8

Failure Mechanism and Sampling Frequency Dependency on TID ..:

González, Carlos J. ; Costa, Bruno L. ; Machado, Diego N....
Journal of Electronic Testing.  37 (2021)  3 - p. 329-343 , 2021
Link: https://doi.org/10.1007/..
 
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9

Robust Convolutional Neural Networks in SRAM-based FPGAs: a..:

Benevenuti, Fabio ; Kastensmidt, Fernanda Lima ; Oliveira, Ádria Barros de...
Journal of Integrated Circuits and Systems.  16 (2021)  2 - p. 1-12 , 2021
Link: https://doi.org/10.29292..
 
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10

The NUMEN Heavy Ion Multidetector for a Complementary Appro..:

Finocchiaro, Paolo ; Acosta, Luis ; Agodi, Clementina...
Universe.  6 (2020)  9 - p. 129 , 2020
Link: https://doi.org/10.3390/..
 
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11

Neutron radiation effects on an electronic system on module:

Lo Presti, Domenico ; Medina, Nilberto H. ; Guazzelli, Marcilei A....
Review of Scientific Instruments.  91 (2020)  8 - p. , 2020
Link: https://doi.org/10.1063/..
 
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12

Heavy Ions Testing of an All-Convolutional Neural Network f..:

, In: 2019 19th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
Benevenuti, Fabio ; de Oliveira, Adria B. ; Lopes, Israel C.... - p. 1-4 , 2019
Link: https://doi.org/10.1109/..
 
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13

Combined ionizing radiation & electromagnetic interference ..:

Goerl, Roger ; Villa, Paulo ; Vargas, Fabian L....
Microelectronics Reliability.  100-101 (2019)  - p. 113341 , 2019
Link: https://doi.org/10.1016/..
 
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14

Analyzing the Influence of using Reconfiguration Memory Scr..:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
de Oliveira, Adria B. ; Benevenuti, Fabio ; Benites, Luis A. C.... - p. 1-4 , 2018
Link: https://doi.org/10.1109/..
 
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15

Portable X-ray fluorescence system to measure Th and U conc..:

Guazzelli da Silveira, Marcilei A. ; Pereira, Bruno Ribeiro ; Medina, Nilberto H..
Journal of Environmental Radioactivity.  189 (2018)  - p. 250-254 , 2018
Link: https://doi.org/10.1016/..
 
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