E-LIB Suche - Ergebnisse für: Mendizabal, Laurent

1

Localized Epitaxial Growth of 402 V Breakdown Voltage Quasi..:

Kaltsounis, Thomas ; El Amrani, Mohammed ; Plaza Arguello, David...
physica status solidi (a). , 2024

Link: https://doi.org/10.1002/..

2

Development and Characterizations of Fine Pitch Flip-Chip I..:

, In: 2023 24th European Microelectronics and Packaging Conference & Exhibition (EMPC),

Gougeon, Julie ; Feautrier, Celine ; Souriau, Jean-Charles... - p. 1-4 , 2023

Link: https://doi.org/10.23919..

3

Characterization of unintentional doping in localized epita..:

Kaltsounis, Thomas ; Haas, Helge ; Lafossas, Matthieu...
Microelectronic Engineering. 273 (2023) - p. 111964 , 2023

Link: https://doi.org/10.1016/..

4

A Bayesian-based optimization approach for accelerated degr..:

, In: 2022 10th International Conference on Systems and Control (ICSC),

Truong, Minh-Tuan ; Do, Phuc ; Mendizabal, Laurent. - p. 96-101 , 2022

Link: https://doi.org/10.1109/..

5

An improved accelerated degradation model for LED reliabili..:

Truong, Minh-Tuan ; Do, Phuc ; Mendizabal, Laurent.
Microelectronics Reliability. 128 (2022) - p. 114428 , 2022

Link: https://doi.org/10.1016/..

6

Improved Low Temperature Sinter Bonding Using Silver Nanocu..:

Bronchy, Maxime ; Roach, Lucien ; Mendizabal, Laurent...
The Journal of Physical Chemistry C. 126 (2022) 3 - p. 1644-1650 , 2022

Link: https://doi.org/10.1021/..

7

Reliability of Laser Diodes for High-rate Optical Communica..:

, In: Advanced Laser Diode Reliability,

Mendizabal, Laurent ; Verdier, Frédéric ; Deshayes, Yannick... - p. 79-137 , 2021

Link: https://doi.org/10.1016/..

8

List of Authors:

, In: Advanced Laser Diode Reliability,

Béchou, Laurent ; Cassidy, Daniel T. ; Danto, Yves... - p. 255-256 , 2021

Link: https://doi.org/10.1016/..

9

Low-temperature silver sintering by colloidal approach:

, In: 2020 IEEE 8th Electronics System-Integration Technology Conference (ESTC),

Bronchy, Maxime ; Souriau, Jean-Charles ; Heintz, Jean-Marc... - p. 1-5 , 2020

Link: https://doi.org/10.1109/..

10

Reliability Assessment of Optoelectronic Systems with Stoch..:

, In: 2019 4th International Conference on System Reliability and Safety (ICSRS),

Truong, Minh-Tuan ; Do, Phuc ; Mendizabal, Laurent. - p. 218-223 , 2019

Link: https://doi.org/10.1109/..

11

Characterization of unintentional doping in localized epita..:

Kaltsounis, Thomas ; Haas, Helge ; Lafossas, Matthieu...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mee.2023.111964. , 2023

Link: https://hal.science/hal-..

12

Characterization of unintentional doping in localized epita..:

Kaltsounis, Thomas ; Haas, Helge ; Lafossas, Matthieu...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mee.2023.111964. , 2023

Link: https://hal.science/hal-..

13

Characterization of unintentional doping in localized epita..:

Kaltsounis, Thomas ; Haas, Helge ; Lafossas, Matthieu...
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.mee.2023.111964. , 2023

Link: https://hal.science/hal-..

14

An improved accelerated degradation model for LED reliabili..:

Truong, Minh-Tuan ; Do Van, Phuc ; Mendizabal, Laurent.
info:eu-repo/semantics/altIdentifier/doi/10.1016/j.microrel.2021.114428. , 2022

Link: https://hal.science/hal-..

15

Improved low temperature sinter bonding using silver nanocu..:

Bronchy, Maxime ; Roach, Lucien ; Mendizabal, Laurent...
info:eu-repo/semantics/altIdentifier/doi/10.1021/acs.jpcc.1c09125. , 2022

Link: https://hal.science/hal-..