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2024 IEEE International Reliability Physics Symposium (IRPS) ,
1
On-Wafer Dynamic Operation of Power GaN-HEMTs: Degradation ..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
2
Role of Gate Hole Injection in Minimizing Substrate Couplin..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
3
$\mathrm{R}_{\text{ON}}$ and $\mathrm{V}_{\text{TH}}$ Extra..:
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2024 IEEE International Reliability Physics Symposium (IRPS) ,
5
Charge Trapping in SiC MOSFETs under Constant Gate Current ..:
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2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD) ,
10
Addressing the electrical degradation of 845 nm micro-trans..:
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2023 IEEE International Reliability Physics Symposium (IRPS) ,
13
High- Temperature PBTI in Trench-Gate Vertical GaN Power MO..:
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2023 AEIT International Conference on Electrical and Electronic Technologies for Automotive (AEIT AUTOMOTIVE) ,
14