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Meneghesso, Gaudenzio
348
results:
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Online (348)
Mediatypes
Articles (Online) (163)
Bookchapter (Online) (20)
OpenAccess-fulltext (165)
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1
Positive VTH Shift in Schottky p-GaN Gate Power HEMTs: Depe..:
Modolo, Nicola
;
De Santi, Carlo
;
Sicre, Sebastien
...
IEEE Transactions on Power Electronics. 39 (2024) 6 - p. 7045-7051 , 2024
Link:
https://doi.org/10.1109/..
?
2
Degradation of 1.3 μm Quantum Dot Laser Diodes for silicon ..:
Zenari, Michele
;
Gioannini, Mariangela
;
Buffolo, Matteo
...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024
Link:
https://doi.org/10.1109/..
?
3
Modeling the Electrical Degradation of Micro-transfer-Print..:
Zenari, Michele
;
Buffolo, Matteo
;
De Santi, Carlo
...
IEEE Transactions on Electron Devices. 71 (2024) 2 - p. 1131-1138 , 2024
Link:
https://doi.org/10.1109/..
?
4
Fast Characterization of Power LEDs: Circuit Design and Exp..:
Roccato, Nicola
;
Piva, Francesco
;
Buffolo, Matteo
...
IEEE Transactions on Electron Devices. 71 (2024) 6 - p. 3753-3760 , 2024
Link:
https://doi.org/10.1109/..
?
5
Microwave and Millimeter-Wave GaN HEMTs: Impact of Epitaxia..:
Zanoni, Enrico
;
De Santi, Carlo
;
Gao, Zhan
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1396-1407 , 2024
Link:
https://doi.org/10.1109/..
?
6
On the CET-Map Ill-Posed Inversion Problem: Theory and Appl..:
Modolo, Nicola
;
De Santi, Carlo
;
Baratella, Giulio
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1646-1653 , 2024
Link:
https://doi.org/10.1109/..
?
7
V-Pits and Trench-Like Defects in High Periodicity MQWs GaN..:
Nicoletto, Marco
;
Caria, Alessandro
;
Rampazzo, Fabiana
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 2051-2057 , 2024
Link:
https://doi.org/10.1109/..
?
8
Deep Level Effects in N-Polar AlGaN/GaN High Electron Mobil..:
, In:
2024 IEEE International Reliability Physics Symposium (IRPS)
,
Saro, Marco
;
de Pieri, Francesco
;
Carlotto, Andrea
... - p. 5B.2-1-5B.2-8 , 2024
Link:
https://doi.org/10.1109/..
?
9
Modeling of the Electrical Characteristics and Degradation ..:
Roccato, Nicola
;
Piva, Francesco
;
De Santi, Carlo
...
IEEE Photonics Journal. 16 (2024) 1 - p. 1-6 , 2024
Link:
https://doi.org/10.1109/..
?
10
Impact of the oxide aperture width on the degradation of 84..:
Zenari, Michele
;
Buffolo, Matteo
;
Rampazzo, Fabiana
...
IEEE Journal of Selected Topics in Quantum Electronics. , 2024
Link:
https://doi.org/10.1109/..
?
11
TCAD Modeling and Simulation of Dark Current-Voltage Charac..:
Nicoletto, Marco
;
Caria, Alessandro
;
De Santi, Carlo
...
IEEE Journal of Photovoltaics. 14 (2024) 3 - p. 450-458 , 2024
Link:
https://doi.org/10.1109/..
?
12
Investigation of degradation dynamics of 265 nm LEDs assist..:
Piva, Francesco
;
Buffolo, Matteo
;
Roccato, Nicola
...
Semiconductor Science and Technology. 39 (2024) 7 - p. 075025 , 2024
Link:
https://doi.org/10.1088/..
?
13
Correlating Interface and Border Traps With Distinctive Fea..:
Zagni, Nicolò
;
Fregolent, Manuel
;
Verzellesi, Giovanni
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1561-1566 , 2024
Link:
https://doi.org/10.1109/..
?
14
Advanced defect spectroscopy in wide-bandgap semiconductors..:
Fregolent, Manuel
;
Piva, Francesco
;
Buffolo, Matteo
...
Journal of Physics D: Applied Physics. 57 (2024) 43 - p. 433002 , 2024
Link:
https://doi.org/10.1088/..
?
15
Influence of V-Pits on the Turn-On Voltage of GaN-Based Hig..:
Nicoletto, Marco
;
Caria, Alessandro
;
Rampazzo, Fabiana
...
IEEE Journal of Photovoltaics. 13 (2023) 6 - p. 891-898 , 2023
Link:
https://doi.org/10.1109/..
1-15