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Mertin, W
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1

Electrical investigation of V-defects in GaN using Kelvin p..:

Lochthofen, A. ; Mertin, W. ; Bacher, G....
Applied Physics Letters.  93 (2008)  2 - p. , 2008
Link: https://doi.org/10.1063/..
 
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2

Microscopic investigation of InGaN/GaN heterostructure lase..:

Lochthofen, A ; Mertin, W ; Bacher, G...
Journal of Physics D: Applied Physics.  41 (2008)  13 - p. 135115 , 2008
Link: https://doi.org/10.1088/..
 
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3

Voltage drop in an (AlxGa1−x)0.5In0.5P light-emitting diode..:

Katzer, Kl.-D. ; Mertin, W. ; Bacher, G...
Applied Physics Letters.  89 (2006)  10 - p. , 2006
Link: https://doi.org/10.1063/..
 
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4

Circuit-internal signal measurements with a needle sensor:

Hartmann, C. ; Mertin, W. ; Bacher, G.
Microelectronics Reliability.  45 (2005)  9-11 - p. 1505-1508 , 2005
Link: https://doi.org/10.1016/..
 
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5

Contactless current measurements using a needle sensor:

Hartmann, C. ; Mertin, W. ; Bacher, G.
Ultramicroscopy.  105 (2005)  1-4 - p. 228-232 , 2005
Link: https://doi.org/10.1016/..
 
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6

High ac-voltage sensitivity of a quartz needle sensor used ..:

Hartmann, C. ; Mertin, W. ; Bacher, G.
Applied Physics Letters.  87 (2005)  21 - p. , 2005
Link: https://doi.org/10.1063/..
 
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7

A new technique for contactless current contrast imaging of..:

Seifert, F. ; Weber, R. ; Mertin, W..
Microelectronics Reliability.  43 (2003)  9-11 - p. 1633-1638 , 2003
Link: https://doi.org/10.1016/..
 
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8

Electric force microscopy testing of digital voltages using..:

Behnke, U ; Kl mper, D ; Mertin, W
Journal of Physics D: Applied Physics.  36 (2003)  6 - p. 748-752 , 2003
Link: https://doi.org/10.1088/..
 
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9

Simultaneous IC-internal voltage and current measurements v..:

Hartmann, C. ; Weber, R. ; Mertin, W....
Microelectronics Reliability.  42 (2002)  9-11 - p. 1759-1762 , 2002
Link: https://doi.org/10.1016/..
 
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10

Voltage-influence of biased interconnection line on integra..:

Weber, R. ; Mertin, W. ; Kubalek, E.
Microelectronics Reliability.  40 (2000)  8-10 - p. 1389-1394 , 2000
Link: https://doi.org/10.1016/..
 
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11

Cross-talk in electric force microscopy testing of parallel..:

Behnke, U. ; Mertin, W. ; Kubalek, E.
Microelectronics Reliability.  40 (2000)  8-10 - p. 1401-1406 , 2000
Link: https://doi.org/10.1016/..
 
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12

Quantitative high frequency-electric force microscope testi..:

Wittpahl, V. ; Ney, C. ; Behnke, U...
Microelectronics Reliability.  39 (1999)  6-7 - p. 951-956 , 1999
Link: https://doi.org/10.1016/..
 
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13

A new bifunctional topography and current probe for scannin..:

Bae, S. ; Schiemann, K. ; Mertin, W...
Microelectronics Reliability.  39 (1999)  6-7 - p. 975-980 , 1999
Link: https://doi.org/10.1016/..
 
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14

Voltage contrast measurements on sub-micrometer structures ..:

Behnke, U. ; Wand, B. ; Mertin, W..
Microelectronics Reliability.  39 (1999)  6-7 - p. 969-974 , 1999
Link: https://doi.org/10.1016/..
 
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15

Cantilever influence suppression of contactless IC-testing ..:

Wittpahl, V. ; Behnke, U. ; Wand, B..
Microelectronics Reliability.  38 (1998)  6-8 - p. 981-986 , 1998
Link: https://doi.org/10.1016/..
 
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