Michalowska-Forsyth, Alicja
22  results:
Search for persons X
?
2

More than scaling: CMOS-integrated circuits in the third de..:

Michalowska-Forsyth, Alicja
e+i Elektrotechnik und Informationstechnik.  141 (2024)  1 - p. 1-2 , 2024
 
?
 
?
5

Generic Analog 8 Bit DAC IP Block in 28nm CMOS for the High..:

, In: 2022 Austrochip Workshop on Microelectronics (Austrochip),
 
?
7

Aspect ratio of radiation-hardened MOS transistors: Modelli..:

Bezhenova, Varvara ; Michalowska-Forsyth, Alicja
e & i Elektrotechnik und Informationstechnik.  135 (2018)  1 - p. 61-68 , 2018
 
?
8

Modeling of Annular Gate MOS Transistors:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
?
9

Low TID Effects on MOS Transistors:

, In: 2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS),
 
?
10

Erratum to: Design and theoretical comparison of input ESD ..:

Michalowska-Forsyth, Alicja ; Schrey, Patrick ; Deutschmann, Bernd
e & i Elektrotechnik und Informationstechnik.  136 (2018)  2 - p. 224-224 , 2018
 
?
 
?
12

Effects of ionizing radiation on integrated circuits:

Bezhenova, Varvara ; Michalowska-Forsyth, Alicja Malgorzata
e & i Elektrotechnik und Informationstechnik.  133 (2016)  1 - p. 39-42 , 2016
 
?
13

Fast28 a low-power fast readout design for SiPMs in 28nm CM..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
Piller, M. ; Ballabriga, R. ; Bandi, F.... - p. 1-1 , 2023
 
?
14

FastIC ASIC readout performance for Cherenkov based TOF-PET..:

, In: 2023 IEEE Nuclear Science Symposium, Medical Imaging Conference and International Symposium on Room-Temperature Semiconductor Detectors (NSS MIC RTSD),
 
1-15