Michl, J.
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2

A Comprehensive Cryogenic CMOS Variability and Reliability ..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Grill, A. ; Michl, J. ; Diaz-Fortuny, J.... - p. 1-3 , 2023
 
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Impact of Single Defects on NBTI and PBTI Recovery in SiO2 ..:

, In: 2022 IEEE International Integrated Reliability Workshop (IIRW),
Tselios, K. ; Knobloch, T. ; Michl, J.... - p. 1-5 , 2022
 
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Evidence of Tunneling Driven Random Telegraph Noise in Cryo..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Michl, J. ; Grill, A. ; Stampfer, B.... - p. 31.3.1-31.3.4 , 2021
 
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NMR crystallography of 2D and 3D assemblies of functional m..:

Dračínský, Martin ; Bastien, Guillaume ; Santos-Hurtado, Carina..
Acta Crystallographica Section A Foundations and Advances.  77 (2021)  a2 - p. C358-C358 , 2021
 
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Distribution of Step Heights of Electron and Hole Traps in ..:

, In: 2020 IEEE International Integrated Reliability Workshop (IIRW),
Tselios, K. ; Stampfer, B. ; Michl, J.... - p. 1-6 , 2020
 
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Reliability and Variability of Advanced CMOS Devices at Cry..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Grill, A. ; Bury, E. ; Michl, J.... - p. 1-6 , 2020
 
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Quantum Mechanical Charge Trap Modeling to Explain BTI at C..:

, In: 2020 IEEE International Reliability Physics Symposium (IRPS),
Michl, J. ; Grill, A. ; Claes, D.... - p. 1-6 , 2020
 
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P1590Percutaneous systemic av-valve repair for the treatmen..:

Rumpf, P M ; Tutarel, O ; Michl, J...
European Heart Journal.  39 (2018)  suppl_1 - p. , 2018
 
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12

List of Contributors:

, In: Efficient Methods for Preparing Silicon Compounds,
Ahmad, S.U. ; Azhakar, R. ; Baceiredo, A.... - p. xix-xxii , 2017
 
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Controlling n -Oligosilane Conformation by Stretching on a ..:

, In: Efficient Methods for Preparing Silicon Compounds,
Fogarty, H.A. ; Chen, X. ; Wang, B.. - p. 355-373 , 2016
 
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Efficient creation of dipolar coupled nitrogen-vacancy spin..:

Jakobi, I ; Momenzadeh, S A ; de Oliveira, F Fávaro...
Journal of Physics: Conference Series.  752 (2016)  1 - p. 012001 , 2016
 
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15

Energy and Spectroscopic Line Shape of the C–O Stretch Mode..:

Endlich, M. ; Michl, A. ; Hildisch, J...
The Journal of Physical Chemistry C.  120 (2016)  21 - p. 11490-11497 , 2016
 
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