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2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) ,
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A Comprehensive Cryogenic CMOS Variability and Reliability ..:
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2022 IEEE International Integrated Reliability Workshop (IIRW) ,
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Impact of Single Defects on NBTI and PBTI Recovery in SiO2 ..:
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2021 IEEE International Electron Devices Meeting (IEDM) ,
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Evidence of Tunneling Driven Random Telegraph Noise in Cryo..:
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2020 IEEE International Integrated Reliability Workshop (IIRW) ,
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Distribution of Step Heights of Electron and Hole Traps in ..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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Reliability and Variability of Advanced CMOS Devices at Cry..:
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2020 IEEE International Reliability Physics Symposium (IRPS) ,
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Quantum Mechanical Charge Trap Modeling to Explain BTI at C..:
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Efficient Methods for Preparing Silicon Compounds ,
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