Michl, Jakob
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1

Identifying Defects in Charge Trapping Related Phenomena:

, In: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),
 
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3

Physics-Based and Closed-Form Model for Cryo-CMOS Subthresh..:

Beckers, Arnout ; Michl, Jakob ; Grill, Alexander...
IEEE Transactions on Nanotechnology.  22 (2023)  - p. 590-596 , 2023
 
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Single- Versus Multi-Step Trap Assisted Tunneling Currents—..:

Schleich, Christian ; Waldhor, Dominic ; Knobloch, Theresia...
IEEE Transactions on Electron Devices.  69 (2022)  8 - p. 4479-4485 , 2022
 
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