Miller, Nicholas C.
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1

A Neural Network-based Manufacturing Variability Modeling o..:

, In: 2024 IEEE 36th International Conference on Microelectronic Test Structures (ICMTS),
 
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2

Effect of High Temperature on the Performance of AlGaN/GaN ..:

Islam, Ahmad E. ; Sepelak, Nicholas P. ; Miesle, Adam T....
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1805-1811 , 2024
 
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6

A 23 – 32 GHz LNA with Near 5 W Power Handling Capability U..:

, In: 2023 18th European Microwave Integrated Circuits Conference (EuMIC),
 
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7

Experimentally Validated Gate-Lag Simulations of AlGaN/GaN ..:

Miller, Nicholas C. ; Grupen, Matt ; Islam, Ahmad E....
IEEE Transactions on Electron Devices.  70 (2023)  2 - p. 435-442 , 2023
 
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8

Experimental Validation of ASM-HEMT Nonlinear Embedding Mod..:

, In: 2023 100th ARFTG Microwave Measurement Conference (ARFTG),
 
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9

W-Band Graded-Channel GaN HEMTs With Record 45% Power-Added..:

Moon, Jeong-Sun ; Grabar, Bob ; Wong, Joel...
IEEE Microwave and Wireless Technology Letters.  33 (2023)  2 - p. 161-164 , 2023
 
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10

New Real-Time Pulsed-RF NVNA Testbed for Isothermal Charact..:

, In: 2023 IEEE/MTT-S International Microwave Symposium - IMS 2023,
 
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14

N-Polar GaN HEMTs in a High-Uniformity 100-mm Wafer Process..:

Arias-Purdue, Andrea ; Rowell, Petra V. ; King, Casey M....
IEEE Microwave and Wireless Technology Letters.  33 (2023)  7 - p. 1011-1014 , 2023
 
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15

Temperature Dependent Large-Signal Modeling of GaN HEMTs at..:

, In: 2023 IEEE Wireless and Microwave Technology Conference (WAMICON),
 
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