Misra, Pankaj
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7

Effect of Al2O3 layer thickness on leakage current and diel..:

Padhi, Partha Sarathi ; Ajimsha, R. S. ; Rai, Sanjay Kumar..
Journal of Materials Science: Materials in Electronics.  34 (2023)  14 - p. , 2023
 
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12

Investigations on RF sputtered TiN thin films and Cu/TiO2/T..:

Sahu, Vikas Kumar ; Das, Amit Kumar ; Ajimsha, R. S....
Journal of Materials Science: Materials in Electronics.  34 (2023)  26 - p. , 2023
 
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