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Mitard, Jerome
73  results:
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1

Predictive and prospective calibrated TCAD to improve devic..:

Eyben, Pierre ; De Keersgieter, An ; Matagne, Philippe...
Japanese Journal of Applied Physics.  63 (2024)  4 - p. 04SP03 , 2024
Link: https://doi.org/10.35848..
 
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2

Impact of Nitridation on Bias Temperature Instability and H..:

Tyaginov, Stanislav ; O'Sullivan, Barry ; Chasin, Adrian...
Micromachines.  14 (2023)  8 - p. 1514 , 2023
Link: https://doi.org/10.3390/..
 
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3

Negative Bias-Temperature Instabilities and Low-Frequency N..:

Luo, Xuyi ; Zhang, En Xia ; Wang, Peng Fei...
IEEE Transactions on Device and Materials Reliability.  23 (2023)  1 - p. 153-161 , 2023
Link: https://doi.org/10.1109/..
 
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4

Automatic prediction of MOSFETs threshold voltage by machin..:

, In: 2023 7th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Choi, Seoyeon ; Park, Dong Geun ; Kim, Min Jung... - p. 1-3 , 2023
Link: https://doi.org/10.1109/..
 
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5

Automatic Prediction of Metal–Oxide–Semiconductor Field‐Eff..:

Choi, Seoyeon ; Park, Dong Geun ; Kim, Min Jung...
Advanced Intelligent Systems.  5 (2023)  1 - p. , 2023
Link: https://doi.org/10.1002/..
 
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6

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Dee..:

Rony, M. W. ; Zhang, En Xia ; Toguchi, Shintaro...
IEEE Transactions on Nuclear Science.  69 (2022)  3 - p. 299-306 , 2022
Link: https://doi.org/10.1109/..
 
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7

Combined Machine Learning Techniques For Characteristics Cl..:

, In: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS),
Kocak, Husnu Murat ; Mitard, Jerome ; Naskali, Ahmet Teoman - p. 1-9 , 2022
Link: https://doi.org/10.1109/..
 
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8

TID Effects in Highly Scaled Gate-All-Around Si Nanowire CM..:

Bonaldo, Stefano ; Gorchichko, Mariia ; Zhang, En Xia...
IEEE Transactions on Nuclear Science.  69 (2022)  7 - p. 1444-1452 , 2022
Link: https://doi.org/10.1109/..
 
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9

Automatic Prediction of Metal–Oxide–Semiconductor Field‐Eff..:

Choi, Seoyeon ; Park, Dong Geun ; Kim, Min Jung...
Advanced Intelligent Systems.  5 (2022)  1 - p. , 2022
Link: https://doi.org/10.1002/..
 
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10

11‐2: Technology Developments in High‐Resolution FMM‐free O..:

Ke, Tung-Huei ; Glushkova, Anastasia ; Sandeheng, Calvin Mona...
SID Symposium Digest of Technical Papers.  52 (2021)  1 - p. 127-130 , 2021
Link: https://doi.org/10.1002/..
 
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11

Oxygen Defect Stability in Amorphous, C-Axis Aligned, and S..:

van Setten, Michiel J. ; Dekkers, Harold F. W. ; Kljucar, Luka...
ACS Applied Electronic Materials.  3 (2021)  9 - p. 4037-4046 , 2021
Link: https://doi.org/10.1021/..
 
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12

Scaling of double-gated WS2 FETs to sub-5nm physical gate l..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Smets, Quentin ; Schram, Tom ; Verreck, Devin... - p. 34.2.1-34.2.4 , 2021
Link: https://doi.org/10.1109/..
 
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13

(Invited) Si-Cap-Free Low-DIT SiGe Gate Stack for High-Perf..:

Arimura, Hiroaki ; Wostyn, Kurt ; Ragnarsson, Lars-Åke...
ECS Transactions.  98 (2020)  5 - p. 377-386 , 2020
Link: https://doi.org/10.1149/..
 
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14

(Invited) Sub-40mV Sigma VTH Igzo nFETs in 300mm Fab:

Mitard, Jerome ; Kljucar, Luka ; Rassoul, Nouredine...
ECS Transactions.  98 (2020)  7 - p. 205-217 , 2020
Link: https://doi.org/10.1149/..
 
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15

Comparison of Temperature Dependent Carrier Transport in Fi..:

Kim, Soohyun ; Kim, Jungchun ; Jang, Doyoung...
Applied Sciences.  10 (2020)  8 - p. 2979 , 2020
Link: https://doi.org/10.3390/..
 
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