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Mitra, Subhasish
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1

Impact dynamics and solidification behaviour of a molten dr..:

Chowdhury, Raju ; Mainul Hoque, Mohammad ; Evans, Geoffrey...
Experimental Thermal and Fluid Science.  154 (2024)  - p. 111156 , 2024
Link: https://doi.org/10.1016/..
 
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2

Bubble size distribution and turbulence characterization in..:

Hoque, Mohammad Mainul ; Mitra, Subhasish ; Evans, Geoffrey
Experimental Thermal and Fluid Science.  155 (2024)  - p. 111199 , 2024
Link: https://doi.org/10.1016/..
 
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3

Effect of surfactant concentration and surface loading on t..:

Wang, Ai ; Banks, Edwin ; Evans, Geoffrey.
Chemical Engineering Science.  288 (2024)  - p. 119812 , 2024
Link: https://doi.org/10.1016/..
 
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4

EMBER: Efficient Multiple-Bits-Per-Cell Embedded RRAM Macro..:

Levy, Akash ; Upton, Luke R. ; Scott, Michael D....
IEEE Journal of Solid-State Circuits.  59 (2024)  7 - p. 2081-2092 , 2024
Link: https://doi.org/10.1109/..
 
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5

Faulty Function Extraction for Defective Circuits:

, In: 2024 IEEE European Test Symposium (ETS),
Nigh, Chris ; Purdy, Ruben ; Li, Wei.. - p. 1-6 , 2024
Link: https://doi.org/10.1109/..
 
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6

Changes in Microscale Liquid Formation in Lump and Sinter M..:

Barrett, Nathan ; Mitra, Subhasish ; Copland, Evan...
Metallurgical and Materials Transactions B.  55 (2024)  3 - p. 1712-1734 , 2024
Link: https://doi.org/10.1007/..
 
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7

Lossless Phonon Transition Through GaN‐Diamond and Si‐Diamo..:

Malakoutian, Mohamadali ; Woo, Kelly ; Rich, Dennis...
Advanced Electronic Materials.  , 2024
Link: https://doi.org/10.1002/..
 
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8

Logic Bug Detection and Localization Using Symbolic Quick E..:

Singh, Eshan ; Lin, David ; Barrett, Clark.
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.  , 2024
Link: https://doi.org/10.1109/..
 
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9

Future Design Direction for SRAM Data Array: Hierarchical S..:

Liu, Hsiao-Hsuan ; Gilardi, Carlo ; Salahuddin, Shairfe M....
IEEE Transactions on Circuits and Systems I: Regular Papers.  , 2024
Link: https://doi.org/10.1109/..
 
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10

Hybrid 2T nMOS/pMOS Gain Cell Memory With Indium-Tin-Oxide ..:

Liu, Shuhan ; Li, Shengman ; Lin, Qing...
IEEE Electron Device Letters.  45 (2024)  2 - p. 188-191 , 2024
Link: https://doi.org/10.1109/..
 
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11

Understanding cohesive zone behaviour of blast furnace base..:

Mitra, Subhasish ; Hoque, Mohammad Mainul ; O'Dea, Damien.
Powder Technology.  439 (2024)  - p. 119686 , 2024
Link: https://doi.org/10.1016/..
 
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12

Understanding the Role of Surface Charge on Nanobubble Capi..:

Dutta, Nilanjan ; Mitra, Subhasish ; Nirmalkar, Neelkanth
Langmuir.  , 2024
Link: https://doi.org/10.1021/..
 
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13

Micro/Nano Circuits and Systems Design and Design Automatio..:

Cauwenberghs, Gert ; Cong, Jason ; Hu, X. Sharon...
Proceedings of the IEEE.  111 (2023)  6 - p. 561-574 , 2023
Link: https://doi.org/10.1109/..
 
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14

High-performance and low parasitic capacitance CNT MOSFET: ..:

, In: 2023 International Electron Devices Meeting (IEDM),
Li, Shengman ; Chao, Tzu-Ang ; Gilardi, Carlo... - p. 1-4 , 2023
Link: https://doi.org/10.1109/..
 
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15

Band-to-Band Tunneling Leakage Current Characterization and..:

Lin, Qing ; Gilardi, Carlo ; Su, Sheng-Kai...
ACS Nano.  , 2023
Link: https://doi.org/10.1021/..
 
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