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Miyase, Kohei
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1

Fault Resilience Techniques for Flash Memory of DNN Acceler..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Lu, Shyue-Kung ; Wu, Yu-Sheng ; Hong, Jin-Hua. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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2

Fault Resilience Techniques for Flash Memory of DNN Acceler..:

, In: 2022 IEEE International Test Conference (ITC),
Lu, Shyue-Kung ; Wu, Yu-Sheng ; Hong, Jin-Hua. - p. 591-600 , 2022
Link: https://doi.org/10.1109/..
 
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3

Effective Switching Probability Calculation to Locate Hotsp..:

, In: 2022 IEEE International Test Conference in Asia (ITC-Asia),
Utsunomiya, Taiki ; Hoshino, Ryu ; Miyase, Kohei... - p. 43-48 , 2022
Link: https://doi.org/10.1109/..
 
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4

A Practical Online Error Detection Method for Functional Sa..:

, In: 2022 IEEE International Test Conference (ITC),
Loki, Kazuya ; Kai, Yasuyuki ; Miyase, Kohei. - p. 63-72 , 2022
Link: https://doi.org/10.1109/..
 
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5

Fine-Grained Built-In Self-Repair Techniques for NAND Flash..:

, In: 2022 IEEE International Test Conference (ITC),
Lu, Shyue-Kung ; Tseng, Shi-Chun ; Miyase, Kohei - p. 391-399 , 2022
Link: https://doi.org/10.1109/..
 
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6

On the Efficacy of Scan Chain Grouping for Mitigating IR-Dr..:

ZHANG, Yucong ; HOLST, Stefan ; WEN, Xiaoqing...
IEICE Transactions on Information and Systems.  E104.D (2021)  6 - p. 816-827 , 2021
Link: https://doi.org/10.1587/..
 
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7

Fault-Aware Dependability Enhancement Techniques for Phase ..:

Lu, Shyue-Kung ; Li, Hui-Ping ; Miyase, Kohei..
Journal of Electronic Testing.  37 (2021)  4 - p. 503-513 , 2021
Link: https://doi.org/10.1007/..
 
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8

Analyzing Running Form with Acceleration Sensor:

, In: 2020 IEEE International Conference on Consumer Electronics (ICCE),
Koga, Chihiro ; Miyase, Kohei ; Tokui, Masato - p. 1-5 , 2020
Link: https://doi.org/10.1109/..
 
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9

Retention-Aware Refresh Techniques for Reducing Power and M..:

Lu, Shyue-Kung ; Huang, Hung-Kai ; Hsu, Chun-Lung..
Journal of Electronic Testing.  35 (2019)  4 - p. 485-495 , 2019
Link: https://doi.org/10.1007/..
 
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10

A Static Method for Analyzing Hotspot Distribution on the L..:

, In: 2019 IEEE International Test Conference in Asia (ITC-Asia),
Miyase, Kohei ; Kawano, Yudai ; Lu, Shyue-Kung.. - p. 73-78 , 2019
Link: https://doi.org/10.1109/..
 
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11

Formal test point insertion for region-based low-capture-po..:

, In: 2016 IEEE 25th Asian Test Symposium / ATS ; sponsors: IEEE, IEEE Computer Society, TTTC [und 8 weitere] ; general co-chairs: Tomoo Inoue (Hiroshima City University), Hiroshi Takahashi (Ehime University)
Eggersglüß, Stephan ; Holst, Stefan ; Tille, Daniel ; Miyase, Kohei.. (2016)  - p. 173-178
Link: https://doi.org/10.1109/..
 
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12

SAT-based post-processing for regional capture power reduct..:

, In: Proceedings, 2016 21st IEEE European Test Symposium (ETS) / organizer, Delft University of Technology ; technical sponsors, IEEE, IEEE Council on Electronic Design Automation
Eggersglüß, Stephan ; Miyase, Kohei ; Wen, Xiaoqing. (2016) 
Link: https://doi.org/10.1109/..
 
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13

Formal Test Point Insertion for Region-based Low-Capture-Po..:

, In: 2016 IEEE 25th Asian Test Symposium (ATS),
Eggersgluss, Stephan ; Holst, Stefan ; Tille, Daniel.. - p. 173-178 , 2016
Link: https://doi.org/10.1109/..
 
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14

Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generati..:

LI, Fuqiang ; WEN, Xiaoqing ; MIYASE, Kohei..
IEICE Transactions on Fundamentals of Electronics, Communications and Computer Sciences.  E99.A (2016)  12 - p. 2310-2319 , 2016
Link: https://doi.org/10.1587/..
 
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15

On Achieving Capture Power Safety in At-Speed Scan-Based Lo..:

TOMITA, Akihiro ; WEN, Xiaoqing ; SATO, Yasuo...
IEICE Transactions on Information and Systems.  E97.D (2014)  10 - p. 2706-2718 , 2014
Link: https://doi.org/10.1587/..
 
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