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Mizota, Momona
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A Block Partitioning Method for Region Exhaustive Test to R..:

, In: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT),
Mizota, Momona ; Hosokawa, Toshinori ; Yoshimura, Masayoshi. - p. 1-6 , 2023
Link: https://doi.org/10.1109/..
 
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