Modolo, N.
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1

Compact Modeling of Nonideal Trapping/Detrapping Processes ..:

Modolo, N. ; De Santi, C. ; Baratella, G....
IEEE Transactions on Electron Devices.  69 (2022)  8 - p. 4432-4437 , 2022
 
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2

Capture and emission time map to investigate the positive V..:

Modolo, N. ; Fregolent, M. ; Masin, F....
Microelectronics Reliability.  138 (2022)  - p. 114708 , 2022
 
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3

Review on the degradation of GaN-based lateral power transi..:

De Santi, C. ; Buffolo, M. ; Rossetto, I....
e-Prime - Advances in Electrical Engineering, Electronics and Energy.  1 (2021)  - p. 100018 , 2021
 
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6

Effects of Ischemic Preconditioning and Postconditioning in..:

Arantes, V.M. ; Bueno, R.T. ; Módolo, R.P....
Transplantation Proceedings.  50 (2018)  10 - p. 3811-3815 , 2018
 
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11

The effects of the combination of intraoperative warming me..:

Fernandes, L. A. ; Koga, F. A. ; Bráz, L. G...
European Journal of Anaesthesiology.  27 (2010)  - p. 235-236 , 2010
 
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12

On the CET-Map Ill-Posed Inversion Problem: Theory and Appl..:

Modolo, N ; De Santi, C ; Baratella, G...
info:eu-repo/semantics/altIdentifier/wos/WOS:001025553000001.  , 2023
 
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13

Failure Physics and Reliability of GaN-Based HEMTs for Micr..:

Zanoni E ; Rampazzo F ; De Santi C...
info:eu-repo/semantics/altIdentifier/wos/WOS:000889904800001.  , 2022
 
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14

Compact Modeling of Nonideal Trapping/Detrapping Processes ..:

Modolo N ; De Santi C ; Baratella G...
info:eu-repo/semantics/altIdentifier/wos/WOS:000824722300001.  , 2022
 
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15

Review on the degradation of GaN-based lateral power transi..:

C. De Santi ; M. Buffolo ; I. Rossetto...
http://www.sciencedirect.com/science/article/pii/S2772671121000176.  , 2021
 
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