I agree that this site is using cookies. You can find further informations
here
.
X
Login
My folder (
0
)
Home
About us
Home About us
Our history
Profile
Press & public relations
Friends
The library in figures
Exhibitions
Projects
Training, internships, careers
Films
Services & Information
Home Services & Information
Lending and interlibrary loans
Returns and renewals
Training and library tours
My Account
Library cards
New to the library?
Download Information
Opening hours
Learning spaces
PC, WLAN, copy, scan and print
Catalogs and collections
Home Catalogs and Collections
Rare books and manuscripts
Digital collections
Subject Areas
Our sites
Home Our sites
Central Library
Law Library (Juridicum)
BB Business and Economics (BB11)
BB Physics and Electrical Engineering
TB Engineering and Social Sciences
TB Economics and Nautical Sciences
TB Music
TB Art & Design
TB Bremerhaven
Contact the library
Home Contact the library
Staff Directory
Open access & publishing
Home Open access & publishing
Reference management: Citavi & RefWorks
Publishing documents
Open Access in Bremen
Show Desktop-Version
Toggle navigation
Modolo, Nicola
13
results:
Search for persons
X
Format
Online (13)
Mediatypes
Articles (Online) (10)
Bookchapter (Online) (1)
OpenAccess-fulltext (2)
Sorted by: Relevance
Sorted by: Year
?
1
Positive VTH Shift in Schottky p-GaN Gate Power HEMTs: Depe..:
Modolo, Nicola
;
De Santi, Carlo
;
Sicre, Sebastien
...
IEEE Transactions on Power Electronics. 39 (2024) 6 - p. 7045-7051 , 2024
Link:
https://doi.org/10.1109/..
?
2
On the CET-Map Ill-Posed Inversion Problem: Theory and Appl..:
Modolo, Nicola
;
De Santi, Carlo
;
Baratella, Giulio
...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1646-1653 , 2024
Link:
https://doi.org/10.1109/..
?
3
Trap-state mapping to model GaN transistors dynamic perform..:
Modolo, Nicola
;
De Santi, Carlo
;
Minetto, Andrea
...
Scientific Reports. 12 (2022) 1 - p. , 2022
Link:
https://doi.org/10.1038/..
?
4
Failure Physics and Reliability of GaN‐Based HEMTs for Micr..:
Zanoni, Enrico
;
Rampazzo, Fabiana
;
De Santi, Carlo
...
physica status solidi (a). 219 (2022) 24 - p. , 2022
Link:
https://doi.org/10.1002/..
?
5
Hot electron effects in AlGaN/GaN HEMTs during hard-switchi..:
Minetto, Andrea
;
Modolo, Nicola
;
Meneghini, Matteo
...
Microelectronics Reliability. 126 (2021) - p. 114208 , 2021
Link:
https://doi.org/10.1016/..
?
6
Impact of an AlGaN spike in the buffer in 0.15 μm AlGaN/GaN..:
Gao, Zhan
;
Rampazzo, Fabiana
;
Meneghini, Matteo
...
Microelectronics Reliability. 126 (2021) - p. 114318 , 2021
Link:
https://doi.org/10.1016/..
?
7
Understanding the effects of off-state and hard-switching s..:
Modolo, Nicola
;
De Santi, Carlo
;
Minetto, Andrea
...
Semiconductor Science and Technology. 36 (2020) 1 - p. 014001 , 2020
Link:
https://doi.org/10.1088/..
?
8
A novel on-wafer approach to test the stability of GaN-base..:
Modolo, Nicola
;
Meneghini, Matteo
;
Barbato, Alessandro
...
Microelectronics Reliability. 114 (2020) - p. 113830 , 2020
Link:
https://doi.org/10.1016/..
?
9
Investigation of the degradations in power GaN-on-Si MIS-HE..:
Sharma, Chandan
;
Modolo, Nicola
;
Chen, Hsi-Han
...
Microelectronics Reliability. 100-101 (2019) - p. 113349 , 2019
Link:
https://doi.org/10.1016/..
?
10
Trap-state mapping to model GaN transistors dynamic perform..:
Modolo, Nicola
;
De Santi, Carlo
;
Minetto, Andrea
...
http://www.ncbi.nlm.nih.gov/pmc/articles/PMC8810804/. , 2022
Link:
http://www.ncbi.nlm.nih...
?
11
Trap-state mapping to model GaN transistors dynamic perform..:
Nicola Modolo
;
Carlo De Santi
;
Andrea Minetto
...
https://doi.org/10.1038/s41598-022-05830-7. , 2022
Link:
https://doi.org/10.1038/..
?
12
Determinants of surgeon choice in cases of suspected implan..:
Zingaretti, Nicola
;
Rampino Cordaro, Emanuele
;
Parodi, Pier Camillo
...
Medicine. 99 (2020) 27 - p. e21134 , 2020
Link:
https://doi.org/10.1097/..
?
13
Contributors:
, In:
Models of Seizures and Epilepsy
,
Aiba, Isamu
;
Andrade, Pedro
;
Angamo, Eskedar A.
... - p. xvii-xxi , 2017
Link:
https://doi.org/10.1016/..
1-13
