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Modregger, P
36
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Online (36)
Mediatypes
Articles (Online) (20)
OpenAccess-fulltext (16)
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1
Increased material differentiation through multi-contrast x..:
Astolfo, A
;
Haig, I G
;
Bate, D
..
Physica Scripta. 98 (2023) 9 - p. 095501 , 2023
Link:
https://doi.org/10.1088/..
?
2
The diffraction volume for square-shaped samples in X-ray d..:
Chakrabarti, P
;
Modregger, P
Journal of Physics: Conference Series. 2380 (2022) 1 - p. 012132 , 2022
Link:
https://doi.org/10.1088/..
?
3
Simple merging technique for improving resolution in qualit..:
Irvine, S
;
Mokso, R
;
Modregger, P
...
Optics Express. 22 (2014) 22 - p. 27257 , 2014
Link:
https://doi.org/10.1364/..
?
4
Two-dimensional ultra-small angle X-ray scattering with gra..:
Modregger, P.
;
Rutishauser, S.
;
Meiser, J.
..
Applied Physics Letters. 105 (2014) 2 - p. , 2014
Link:
https://doi.org/10.1063/..
?
5
TH-A-141-01: Combining Wave-Optics and Monte Carlo Methods ..:
Peter, S
;
Modregger, P
;
Fix, MK
...
Medical Physics. 40 (2013) 6Part31 - p. 522-522 , 2013
Link:
https://doi.org/10.1118/..
?
6
Differential X-ray phase contrast tomography of Alzheimer p..:
Pinzer, B R
;
Cacquevel, M
;
Modregger, P
..
Journal of Instrumentation. 8 (2013) 5 - p. C05005-C05005 , 2013
Link:
https://doi.org/10.1088/..
?
7
Post-detection analysis for grating-based ultra-small angle..:
Scattarella, F.
;
Tangaro, S.
;
Modregger, P.
...
Physica Medica. 29 (2013) 5 - p. 478-486 , 2013
Link:
https://doi.org/10.1016/..
?
8
Imaging brain amyloid deposition using grating-based differ..:
Pinzer, B.R.
;
Cacquevel, M.
;
Modregger, P.
...
NeuroImage. 61 (2012) 4 - p. 1336-1346 , 2012
Link:
https://doi.org/10.1016/..
?
9
Imaging the Ultrasmall-Angle X-Ray Scattering Distribution ..:
Modregger, P.
;
Scattarella, F.
;
Pinzer, B. R.
...
Physical Review Letters. 108 (2012) 4 - p. , 2012
Link:
https://doi.org/10.1103/..
?
10
Synchrotron-based X-ray Tomographic Microscopy at the Swiss..:
Marone, F.
;
Mokso, R.
;
Fife, J.L.
...
Synchrotron Radiation News. 24 (2011) 6 - p. 24-29 , 2011
Link:
https://doi.org/10.1080/..
?
11
Epitaxial lateral overgrowth in the system Si/SiOx/Si: The ..:
Hanke, M.
;
Köhler, R.
;
Schäfer, P.
...
Physical Review B. 83 (2011) 12 - p. , 2011
Link:
https://doi.org/10.1103/..
?
12
High resolution, large field of view x-ray differential pha..:
Thuering, T.
;
Modregger, P.
;
Grund, T.
...
Applied Physics Letters. 99 (2011) 4 - p. , 2011
Link:
https://doi.org/10.1063/..
?
13
Sensitivity of X-ray grating interferometry:
Modregger, P.
;
Pinzer, B. R.
;
Thüring, T.
...
Optics Express. 19 (2011) 19 - p. 18324 , 2011
Link:
https://doi.org/10.1364/..
?
14
Moderne 2-D und 3-D abbildende Röntgenverfahren mit Synchro..:
Baumbach, Tilo
;
dos Santos Rolo, T.
;
Ershov, A.
...
Materials Testing. 51 (2009) 10 - p. 642-651 , 2009
Link:
https://doi.org/10.3139/..
?
15
The micro-imaging station of the TopoTomo beamline at the A..:
Rack, A.
;
Weitkamp, T.
;
Bauer Trabelsi, S.
...
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 267 (2009) 11 - p. 1978-1988 , 2009
Link:
https://doi.org/10.1016/..
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