Moghaddam, Elham
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1

Time and Area Optimized Testing of Automotive ICs:

Mukherjee, Nilanjan ; Tille, Daniel ; Sapati, Mahendar...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  29 (2021)  1 - p. 76-88 , 2021
 
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2

Test Time and Area Optimized BrST Scheme for Automotive ICs:

, In: 2019 IEEE International Test Conference (ITC),
 
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3

Embedded Deterministic Test Points:

Acero, Cesar ; Feltham, Derek ; Liu, Yingdi...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  10 - p. 2949-2961 , 2017
 
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4

Design for low test pattern counts:

, In: Proceedings of the 52nd Annual Design Automation Conference,
 
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6

A Low-cost Waveguide Switch Using Glide-symmetric Holey Ele..:

, In: 2023 31st International Conference on Electrical Engineering (ICEE),
 
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13

Compact beamforming network for producing multiple orthogon..:

Sharifi Moghaddam, Elham ; Ahmadi, Arash
International Journal of Microwave and Wireless Technologies.  , 2023
 
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14

Effect of a follow‐up counseling program on mental health o..:

Adib Moghaddam, Elham ; Kazemi, Ashraf ; Kheirabadi, Gholamreza
International Journal of Gynecology & Obstetrics.  162 (2023)  1 - p. 346-351 , 2023
 
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