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Mohsenzade, Sadegh
10  results:
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1

Gate Oxide Degradation Condition Monitoring Technique for H..:

Naghibi, Javad ; Mohsenzade, Sadegh ; Mehran, Kamyar.
IEEE Transactions on Power Electronics.  38 (2023)  1 - p. 1079-1091 , 2023
Link: https://doi.org/10.1109/..
 
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2

Evaluation of Turning on/off Delay Time Interval as a Precu..:

, In: 2023 14th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC),
Jazayeri, Mojtaba ; Mohsenzade, Sadegh - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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3

Controllable DC Fault Current Limiter with Loss Reduction:

, In: 2023 14th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC),
Jafari, Alireza ; Mohsenzade, Sadegh ; Razi-Kazemi, Ali A. - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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4

Real-Time Degradation Level Assessment of IGBT Gate Oxide L..:

Jazayeri, Mojtaba ; Mohsenzade, Sadegh ; Naghibi, Javad.
IEEE Transactions on Power Electronics.  38 (2023)  12 - p. 16153-16164 , 2023
Link: https://doi.org/10.1109/..
 
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5

On the Effect of Parasitic Capacitances on the Voltage Shar..:

, In: 2023 14th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC),
Ghaderi, Alireza ; Azam Rajabian, Amir ; Mohsenzade, Sadegh - p. 1-5 , 2023
Link: https://doi.org/10.1109/..
 
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6

On the Effect of SiC Power MOSFET Gate Oxide Degradation in..:

, In: 2022 IEEE Energy Conversion Congress and Exposition (ECCE),
Naghibi, Javad ; Mohsenzade, Sadegh ; Iqbal, Saqib.. - p. 1-6 , 2022
Link: https://doi.org/10.1109/..
 
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7

Investigating the Effect of the Power Path Parasitic Induct..:

, In: 2022 13th Power Electronics, Drive Systems, and Technologies Conference (PEDSTC),
Azam Rajabian, Amir ; Mohsenzade, Sadegh - p. 414-419 , 2022
Link: https://doi.org/10.1109/..
 
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8

Reliability Enhancement of Power IGBTs under Short-Circuit ..:

Mohsenzade, Sadegh ; Naghibi, Javad ; Mehran, Kamyar
Energies.  14 (2021)  21 - p. 7397 , 2021
Link: https://doi.org/10.3390/..
 
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9

Reliability Enhancement of Power IGBTs under Short-Circuit ..:

Sadegh Mohsenzade ; Javad Naghibi ; Kamyar Mehran
E: Electric Vehicles.  , 2021
Link: https://doi.org/10.3390/..
 
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10

Reliability Enhancement of Power IGBTs under Short-Circuit ..:

Sadegh Mohsenzade ; Javad Naghibi ; Kamyar Mehran
https://www.mdpi.com/1996-1073/14/21/7397.  , 2021
Link: https://doi.org/10.3390/..
 
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