Mosca, M.
~ 2300  results:
Search for persons X
?
 
?
 
?
 
?
 
?
 
?
 
?
 
?
13

Custom measurement system for memristor characterisation:

Lupo, F.V. ; Scirè, D. ; Mosca, M....
Solid-State Electronics.  186 (2021)  - p. 108049 , 2021
 
?
15

Defect incorporation in In-containing layers and quantum we..:

Piva, F ; De Santi, C ; Caria, A...
Journal of Physics D: Applied Physics.  54 (2020)  2 - p. 025108 , 2020
 
1-15