Muhin, Anton
16  results:
Search for persons X
?
2

Investigation of degradation dynamics of 265 nm LEDs assist..:

Piva, Francesco ; Buffolo, Matteo ; Roccato, Nicola...
Semiconductor Science and Technology.  39 (2024)  7 - p. 075025 , 2024
 
?
5

Modeling the electrical characteristic and degradation mech..:

, In: 2023 International Conference on Numerical Simulation of Optoelectronic Devices (NUSOD),
 
?
10

Electrical properties and microstructure of vanadium-based ..:

Lapeyrade, Mickael ; Muhin, Anton ; Einfeldt, Sven...
Semiconductor Science and Technology.  28 (2013)  12 - p. 125015 , 2013
 
?
12

COMMAND VERIFICATION:

Shuvaev, Roman ; Muhin, Anton ; Warren, Andrew...
https://www.tdcommons.org/dpubs_series/20.  , 2015
 
1-15