Mura G. D
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2

Early failure of high-power white LEDs for outdoor applicat..:

Caria, A. ; Fraccaroli, R. ; Pierobon, G....
Microelectronics Reliability.  150 (2023)  - p. 115142 , 2023
 
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4

Very high energy sky monitoring with the Southern Wide-fiel..:

La Mura, G ; Barres de Almeida, U ; Longo, F
Journal of Physics: Conference Series.  2429 (2023)  1 - p. 012022 , 2023
 
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5

Correction to: The relation between optical and γ-ray emiss..:

La Mura, G ; Becerra Gonzalez, J ; Chiaro, G..
Monthly Notices of the Royal Astronomical Society.  522 (2023)  1 - p. 362-366 , 2023
 
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6

Electronic Components Authentication via Physical Analysis:

, In: 2023 IEEE 33rd International Conference on Microelectronics (MIEL),
Mura, G. ; Carta, S. ; Ricci, P. C.. - p. 1-4 , 2023
 
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7

The relation between optical and γ-ray emission in BL Lac s..:

La Mura, G ; Becerra Gonzalez, J ; Chiaro, G..
Monthly Notices of the Royal Astronomical Society.  515 (2022)  4 - p. 4810-4827 , 2022
 
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8

The Mercedes water Cherenkov detector:

Assis, P. ; Bakalová, A. ; Barres de Almeida, U....
The European Physical Journal C.  82 (2022)  10 - p. , 2022
 
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9

Hunting extreme BL Lacertae blazars with Fermi-Large Area T..:

Nievas Rosillo, M ; Domínguez, A ; Chiaro, G...
Monthly Notices of the Royal Astronomical Society.  512 (2022)  1 - p. 137-159 , 2022
 
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10

Gamma-ray burst detection prospects for next generation gro..:

La Mura, G ; Barres de Almeida, U ; Conceição, R...
Monthly Notices of the Royal Astronomical Society.  508 (2021)  1 - p. 671-679 , 2021
 
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11

Peculiar failure mechanisms in GaN power transistors:

Vanzi, M. ; Mura, G.
Microelectronics Reliability.  114 (2020)  - p. 113896 , 2020
 
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12

The radio structure of the narrow-line Seyfert 1 Mrk 783 wi..:

Congiu, E ; Kharb, P ; Tarchi, A...
Monthly Notices of the Royal Astronomical Society.  499 (2020)  3 - p. 3149-3157 , 2020
 
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13

Surgery for stage iv gastric cancer: An Italian perspective:

Ministrini, S. ; Bencivenga, M. ; Molteni, B....
European Journal of Surgical Oncology.  46 (2020)  12 - p. e11 , 2020
 
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14

Analysis of counterfeit electronics:

Mura, G. ; Murru, R. ; Martines, G.
Microelectronics Reliability.  114 (2020)  - p. 113793 , 2020
 
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15

Radio morphology of southern narrow-line Seyfert 1 galaxies..:

Chen, S ; Järvelä, E ; Crepaldi, L...
Monthly Notices of the Royal Astronomical Society.  498 (2020)  1 - p. 1278-1297 , 2020
 
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