Nagatomi, T.
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3

Approach to Quantitative Evaluation of Electron-Induced Deg..:

Nagatomi, T. ; Nakamura, H. ; Takai, Y..
e-Journal of Surface Science and Nanotechnology.  9 (2011)  - p. 277-288 , 2011
 
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4

Absolutely determined inelastic mean free paths for 300–300..:

Nagatomi, T. ; Tanuma, S. ; Goto, K.
Surface and Interface Analysis.  42 (2010)  10-11 - p. 1537-1540 , 2010
 
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5

High Depth Resolution Auger Depth Profiling Analysis Using ..:

Ogiwara, T ; Nagatomi, T ; Tanuma, S
Microscopy and Microanalysis.  16 (2010)  S2 - p. 440-441 , 2010
 
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6

Working group report of database construction of secondary ..:

Nagatomi, T. ; Goto, K. ; Shimizu, R.
Surface and Interface Analysis.  42 (2010)  10-11 - p. 1541-1543 , 2010
 
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7

Surface energy loss processes in XPS studied by absolute re..:

Nagatomi, T. ; Goto, K.
Journal of Electron Spectroscopy and Related Phenomena.  178-179 (2010)  - p. 178-185 , 2010
 
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10

Inelastic mean free path, surface excitation parameter, and..:

Nagatomi, T. ; Goto, K.
Applied Surface Science.  256 (2009)  4 - p. 1200-1204 , 2009
 
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11

Incident angle and energy dependences of low‐energy Ar+ ion..:

Nagatomi, T. ; Bungo, T. ; Takai, Y.
Surface and Interface Analysis.  41 (2009)  7 - p. 581-589 , 2009
 
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12

Application of experimentally determined inelastic mean fre..:

Nagatomi, T. ; Goto, K.
Surface and Interface Analysis.  40 (2008)  13 - p. 1755-1759 , 2008
 
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14

Auger spectral shape analysis of Sc‐O/W(100) system during ..:

Nakanishi, Y. ; Nagatomi, T. ; Takai, Y.
Surface and Interface Analysis.  40 (2008)  13 - p. 1768-1771 , 2008
 
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