Search for persons
X
?
2020 IEEE 38th VLSI Test Symposium (VTS) ,
5
Special Session – Emerging Memristor Based Memory and CIM A..:
, In:
?
2020 IEEE European Test Symposium (ETS) ,
6
Defect Characterization and Test Generation for Spintronic-..:
, In:
?
Proceedings of the 23rd Conference on Design, Automation and Test in Europe ,
7
Dynamic faults based hardware trojan design in STT-MRAM:
, In:
?
2020 IEEE International Reliability Physics Symposium (IRPS) ,
8
Physics based modeling of bimodal electromigration failure ..:
, In:
?
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE) ,
9
Dynamic Faults based Hardware Trojan Design in STT-MRAM:
, In:
?
Proceedings of the 23rd Asia and South Pacific Design Automation Conference ,
13