E-LIB Suche - Ergebnisse für: Najm, Farid N.

1

Fast Current Constraints Generation for Chip Safety:

, In: 2024 25th International Symposium on Quality Electronic Design (ISQED),

Feghali, Cedric ; Najm, Farid N. - p. 1-8 , 2024

Link: https://doi.org/10.1109/..

2

Electromigration Assessment in Power Grids with Account of ..:

, In: Proceedings of the 2023 International Symposium on Physical Design,

Kteyan, Armen ; Sukharev, Valeriy ; Volkov, Alexander... - p. 124-132 , 2023

Link: https://dl.acm.org/doi/1..

3

Fast Electromigration Simulation for Chip Power Grids:

, In: 2023 24th International Symposium on Quality Electronic Design (ISQED),

Shahriari, Bijan ; Najm, Farid N. - p. 1-8 , 2023

Link: https://doi.org/10.1109/..

4

Experimental Validation of a Novel Methodology for Electrom..:

Sukharev, Valeriy ; Kteyan, Armen ; Najm, Farid N....
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 41 (2022) 11 - p. 4837-4850 , 2022

Link: https://doi.org/10.1109/..

5

Equivalent circuits for electromigration:

Najm, Farid N.
Microelectronics Reliability. 123 (2021) - p. 114200 , 2021

Link: https://doi.org/10.1016/..

6

Electromigration checking using a stochastic effective curr..:

, In: Proceedings of the 39th International Conference on Computer-Aided Design,

Issa, Adam ; Sukharev, Valeriy ; Najm, Farid N. - p. 1-8 , 2020

Link: https://dl.acm.org/doi/1..

7

Power Grid Fixing for Electromigration-induced Voltage Fail..:

, In: 2019 IEEE/ACM International Conference on Computer-Aided Design (ICCAD),

Moudallal, Zahi ; Sukharev, Valeriy ; Najm, Farid N. - p. 1-8 , 2019

Link: https://doi.org/10.1109/..

8

Power Scheduling With Active $RC$Power Grids:

Moudallal, Zahi ; Najm, Farid N.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27 (2019) 2 - p. 444-457 , 2019

Link: https://doi.org/10.1109/..

9

Fast physics-based electromigration assessment by efficient..:

, In: Proceedings of the 36th International Conference on Computer-Aided Design,

Chatterjee, Sandeep ; Sukharev, Valeriy ; Najm, Farid N. - p. 659-666 , 2017

Link: https://dl.acm.org/doi/1..

10

Generating Current Constraints to Guarantee RLC Power Grid ..:

Moudallal, Zahi ; Najm, Farid N.
ACM Transactions on Design Automation of Electronic Systems (TODAES). 22 (2017) 4 - p. 1-39 , 2017

Link: https://dl.acm.org/doi/1..

11

Power grid verification under transient constraints:

, In: Proceedings of the 36th International Conference on Computer-Aided Design,

Fawaz, Mohammad ; Najm, Farid N. - p. 593-600 , 2017

Link: https://dl.acm.org/doi/1..

12

Generating Current Constraints to Guarantee RLC Power Grid ..:

Moudallal, Zahi ; Najm, Farid N.
ACM Transactions on Design Automation of Electronic Systems. 22 (2017) 4 - p. 1-39 , 2017

Link: https://doi.org/10.1145/..

13

Power scheduling with active power grids:

, In: Proceedings of the 36th International Conference on Computer-Aided Design,

Moudallal, Zahi ; Najm, Farid N. - p. 466-473 , 2017

Link: https://dl.acm.org/doi/1..

14

A fast layer elimination approach for power grid reduction:

, In: Proceedings of the 35th International Conference on Computer-Aided Design,

Yassine, Abdul-Amir ; Najm, Farid N. - p. 1-8 , 2016

Link: https://dl.acm.org/doi/1..

15

Fast physics-based electromigration checking for on-die pow..:

, In: Proceedings of the 35th International Conference on Computer-Aided Design,

Chatterjee, Sandeep ; Sukharev, Valeriy ; Najm, Farid N. - p. 1-8 , 2016

Link: https://dl.acm.org/doi/1..