Nakagawa, Kiyokazu
134  results:
Search for persons X
?
 
?
2

Influences of lattice strain and SiGe buffer layer thicknes..:

Fujisawa, Taisuke ; Onogawa, Atsushi ; Horiuchi, Miki...
Materials Science in Semiconductor Processing.  161 (2023)  - p. 107476 , 2023
 
?
4

Thermodynamic analyses of thermal evaporation of BaSi2:

Hara, Kosuke O. ; Arimoto, Keisuke ; Yamanaka, Junji.
Japanese Journal of Applied Physics.  59 (2020)  SF - p. SFFA02 , 2020
 
?
7

HREM Observation and Identification of the Causality of Twi..:

Yamanaka, Junji ; Sano, Yuichi ; Saito, Shingo...
Microscopy and Microanalysis.  26 (2020)  S2 - p. 286-288 , 2020
 
?
8

Strain relaxation process and evolution of crystalline morp..:

Saito, Shingo ; Sano, Yuichi ; Yamada, Takane...
Materials Science in Semiconductor Processing.  113 (2020)  - p. 105042 , 2020
 
?
9

Hole mobility in Strained Si/Relaxed SiGe/Si(110) hetero st..:

Namiuchi, Daichi ; Onogawa, Atsushi ; Fujisawa, Taisuke...
Materials Science in Semiconductor Processing.  113 (2020)  - p. 105052 , 2020
 
?
10

Hole mobility enhancement observed in (110)-oriented strain..:

Arimoto, Keisuke ; Utsuyama, Naoto ; Mitsui, Shohei...
Japanese Journal of Applied Physics.  59 (2020)  SG - p. SGGK06 , 2020
 
?
12

Fabrication of SnS/BaSi2 heterojunction by thermal evaporat..:

Hara, Kosuke O. ; Arimoto, Keisuke ; Yamanaka, Junji.
Japanese Journal of Applied Physics.  58 (2019)  SB - p. SBBF01 , 2019
 
?
 
?
15

Stability of strain in Si layers formed on SiGe/Si(110) het..:

Arimoto, Keisuke ; Onogawa, Atsushi ; Saito, Shingo...
Semiconductor Science and Technology.  33 (2018)  12 - p. 124016 , 2018
 
1-15