Nakamoto, Mark
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1

System Design Technology Co-Optimization for 3D Integration..:

, In: 2021 IEEE International Electron Devices Meeting (IEDM),
Song, S.C. ; Nallapati, Giri ; Khan, Irfan... - p. 22.3.1-22.3.4 , 2021
 
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2

Numerical Model for Understanding Failure Mechanism of Back..:

, In: 2020 IEEE 70th Electronic Components and Technology Conference (ECTC),
Wang, Wei ; Zhao, Wei ; Nakamoto, Mark... - p. 229-235 , 2020
 
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3

Electrical Characterization for Intertier Connections and T..:

Wu, Xiaoxia ; Zhao, Wei ; Nakamoto, Mark...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  20 (2012)  1 - p. 186-191 , 2012
 
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11

Contributors:

, In: Sperling Pediatric Endocrinology,
 
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