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2023 IEEE International Test Conference in Asia (ITC-Asia) ,
3
A Physically Unclonable Function Using Time-to-Digital Conv..:
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Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems ,
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12 bit 1 ps Resolution Time-to-Digital Converter for LSI Te..:
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Proceedings of Eighth International Congress on Information and Communication Technology; Lecture Notes in Networks and Systems ,
6
Design Consideration for LC Analog Filters: Inductor ESR Co..:
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2023 IEEE International Test Conference (ITC) ,
8
Low Distortion Sinusoidal Signal Generator with Harmonics C..:
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2022 IEEE 31st Asian Test Symposium (ATS) ,
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High Precision Voltage Measurement System Utilizing Low-End..:
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2022 IEEE 40th VLSI Test Symposium (VTS) ,
10
Innovative Practices Track: Innovative Analog Circuit Testi..:
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2022 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) ,
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