I agree that this site is using cookies. You can find further informations here.
X
Nallatamby, Jean-Christophe
71  results:
Search for persons X
?
1

Inspection of Trapping and Detrapping Dynamics in Fe- and C..:

, In: 2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM),
Raja, P. Vigneshwara ; Painter, Vaidehi Vijay ; Sommet, Raphael. - p. 1-3 , 2024
Link: https://doi.org/10.1109/..
 
?
2

Estimation of Zero-Field Activation Energy for Traps in Fe-..:

Raja, P. Vigneshwara ; Painter, Vaidehi Vijay ; Dupouy, Emmanuel..
IEEE Transactions on Electron Devices.  71 (2024)  3 - p. 1626-1632 , 2024
Link: https://doi.org/10.1109/..
 
?
3

Electrical characteristics and trap signatures for Schottky..:

Kumari, Shikha ; Singh, Rashmi ; Kumar, Shivam...
Semiconductor Science and Technology.  , 2024
Link: https://doi.org/10.1088/..
 
?
4

Thermal multiscale simulation of a FO-WLP SiP including a G..:

, In: 2024 25th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE),
Kakou, N'Doua Luc Arnaud ; Sommet, Raphael ; Brunel, Laurent... - p. 1-4 , 2024
Link: https://doi.org/10.1109/..
 
?
5

HTRB Stress Effects on Static and Dynamic Characteristics o..:

Raja, P. Vigneshwara ; Nallatamby, Jean-Christophe ; Bouslama, Mohamed...
IEEE Transactions on Microwave Theory and Techniques.  71 (2023)  5 - p. 1957-1966 , 2023
Link: https://doi.org/10.1109/..
 
?
6

Surface and Buffer Trap Signatures in Fe-doped AlGaN/GaN HE..:

, In: 2022 17th European Microwave Integrated Circuits Conference (EuMIC),
Nallatamby, Jean-Christophe ; Silva Dos Santos, Jose Anderson ; Raja, P. Vigneshwara.. - p. 1-4 , 2022
Link: https://doi.org/10.23919..
 
?
7

Estimation of Trapping Induced Dynamic Reduction in 2DEG De..:

Raja, P. Vigneshwara ; Dupouy, Emmanuel ; Bouslama, Mohamed..
IEEE Transactions on Electron Devices.  69 (2022)  9 - p. 4864-4869 , 2022
Link: https://doi.org/10.1109/..
 
?
8

HTRB Stress Effects on 0.15 µm AlGaN/GaN HEMT Performance:

, In: 2022 IEEE MTT-S International Conference on Numerical Electromagnetic and Multiphysics Modeling and Optimization (NEMO),
Raja, P. Vigneshwara ; Nallatamby, Jean-Christophe ; Bouslama, Mohamed... - p. 1-4 , 2022
Link: https://doi.org/10.1109/..
 
?
9

Trapping effects on AlGaN/GaN HEMT characteristics:

Vigneshwara Raja, P. ; Nallatamby, Jean-Christophe ; DasGupta, Nandita.
Solid-State Electronics.  176 (2021)  - p. 107929 , 2021
Link: https://doi.org/10.1016/..
 
?
10

Understanding the Thermal Time Constants of GaN HEMTs throu..:

Jakani, Anass ; Sommet, Raphael ; Simbélie, Frédérique.
Electronics.  10 (2021)  24 - p. 3138 , 2021
Link: https://doi.org/10.3390/..
 
?
11

Identification of Buffer and Surface Traps in Fe-Doped AlGa..:

Raja, P. Vigneshwara ; Subramani, Nandha Kumar ; Gaillard, Florent...
Electronics.  10 (2021)  24 - p. 3096 , 2021
Link: https://doi.org/10.3390/..
 
?
12

Impact of the Location of Iron Buffer Doping on Trap Signat..:

, In: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC),
Sharma, Khushboo ; Dupouy, Emmanuel ; Bouslama, Mohamed.. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
?
13

Dual Approach for the characterization of the thermal imped..:

, In: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMiC),
Jakani, Anass ; Sommet, Raphael ; Nallatamby, Jean-Christophe. - p. 1-3 , 2020
Link: https://doi.org/10.1109/..
 
?
14

Time Domain Drain Lag Measurement and TCAD-based Device Sim..:

, In: 2019 14th European Microwave Integrated Circuits Conference (EuMIC),
Subramani, Nandha Kumar ; Bouslama, Mohamed ; Sommet, Raphael. - p. 21-24 , 2019
Link: https://doi.org/10.23919..
 
?
15

Characterization of Different Technologies of GaN HEMTs of ..:

, In: 2019 14th European Microwave Integrated Circuits Conference (EuMIC),
Bouslama, Mohamed ; Sommet, Raphael ; Nallatamby, Jean-Christophe - p. 29-32 , 2019
Link: https://doi.org/10.23919..
 
1-15