E-LIB Suche - Ergebnisse für: Nam, Seunggeol

1

A Comprehensive Study of Read-After-Write-Delay for Ferroel..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Myeong, Ilho ; Lim, Suhwan ; Kim, Taeyoung... - p. 9B.3-1-9B.3-6 , 2024

2

Laminated Ferroelectric FET With Large Memory Window and Hi..:

Lee, Hyun Jae ; Nam, Seunggeol ; Lee, Yunseong...
IEEE Transactions on Electron Devices. 71 (2024) 4 - p. 2411-2416 , 2024

Link: https://doi.org/10.1109/..

3

Drain Current Degradation Induced by Charge Trapping/De-Tra..:

, In: 2024 IEEE International Reliability Physics Symposium (IRPS),

Kim, Taeyoung ; Lim, Suhwan ; Myeong, Ilho... - p. P6.EM-1-P6.EM-4 , 2024

Link: https://doi.org/10.1109/..

4

Interfacial Layer Selection Methodology for Customized Ferr..:

Lee, Hyun Jae ; Moon, Taehwan ; Nam, Seunggeol...
IEEE Transactions on Electron Devices. 71 (2024) 3 - p. 1907-1912 , 2024

Link: https://doi.org/10.1109/..

5

Negative differential capacitance in ultrathin ferroelectri..:

Jo, Sanghyun ; Lee, Hyangsook ; Choe, Duk-Hyun...
Nature Electronics. 6 (2023) 5 - p. 390-397 , 2023

Link: https://doi.org/10.1038/..

6

Revival of Ferroelectric Memories Based on Emerging Fluorit..:

Park, Ju Yong ; Choe, Duk‐Hyun ; Lee, Dong Hyun...
Advanced Materials. 35 (2023) 43 - p. , 2023

Link: https://doi.org/10.1002/..

7

Comprehensive Design Guidelines of Gate Stack for QLC and H..:

, In: 2023 International Electron Devices Meeting (IEDM),

Lim, Suhwan ; Kim, Taeyoung ; Myeong, Ilho... - p. 1-4 , 2023

Link: https://doi.org/10.1109/..

8

Revival of Ferroelectric Memories Based on Emerging Fluorit..:

Park, Ju Yong ; Choe, Duk‐Hyun ; Lee, Dong Hyun...
Advanced Materials. 35 (2023) 43 - p. , 2023

Link: https://doi.org/10.1002/..

9

Parallel synaptic design of ferroelectric tunnel junctions ..:

Moon, Taehwan ; Lee, Hyun Jae ; Nam, Seunggeol...
Neuromorphic Computing and Engineering. 3 (2023) 2 - p. 024001 , 2023

Link: https://doi.org/10.1088/..

10

An analytical interpretation of the memory window in ferroe..:

Yoo, Sijung ; Choe, Duk-Hyun ; Lee, Hyun Jae...
Applied Physics Letters. 123 (2023) 22 - p. , 2023

Link: https://doi.org/10.1063/..

11

Graphene Capping of Cu Back-End-of-Line Interconnects Reduc..:

Shin, Keun Wook ; Cho, Yeonchoo ; Nam, Seung-Geol...
ACS Applied Nano Materials. 6 (2023) 6 - p. 4170-4177 , 2023

Link: https://doi.org/10.1021/..

12

Unexpectedly low barrier of ferroelectric switching in HfO2..:

Choe, Duk-Hyun ; Kim, Sunghyun ; Moon, Taehwan...
Materials Today. 50 (2021) - p. 8-15 , 2021

Link: https://doi.org/10.1016/..

13

Fermi Level Pinning at Electrical Metal Contacts of Monolay..:

Kim, Changsik ; Moon, Inyong ; Lee, Daeyeong...
ACS Nano. 11 (2017) 2 - p. 1588-1596 , 2017

Link: https://doi.org/10.1021/..

14

Reconfigurable van der Waals Heterostructured Devices with ..:

Heo, Jinseong ; Jeong, Heejeong ; Cho, Yeonchoo...
Nano Letters. 16 (2016) 11 - p. 6746-6754 , 2016

Link: https://doi.org/10.1021/..

15

Local and Nonlocal Fraunhofer-like Pattern from an Edge-Ste..:

Lee, Jae Hyeong ; Lee, Gil-Ho ; Park, Joonbum...
Nano Letters. 14 (2014) 9 - p. 5029-5034 , 2014

Link: https://doi.org/10.1021/..