Narayanan, Vijaykrishnan
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1

Evaluating the Robustness of Complementary Channel Ferroele..:

Jiang, Zhouhang ; Guo, Zixiang ; Luo, Xuyi...
IEEE Electron Device Letters.  45 (2024)  7 - p. 1165-1168 , 2024
 
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2

Enhancing Lifetime and Performance of MLC NVM Caches Using ..:

Sivakumar, S. ; Jose, John ; Narayanan, Vijaykrishnan
ACM Transactions on Design Automation of Electronic Systems.  29 (2024)  3 - p. 1-24 , 2024
 
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4

Asia Pacific Advanced Network: 56th International Conferenc.. 

Communications in Computer and Information Science, 1995
Herath, Damayanthi ; Date, Susumu ; Jayasinghe, Upul... - 1st ed. 2024 . , 2024
 
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6

PRIMATE: Processing in Memory Acceleration for Dynamic Toke..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Pan, Yue ; Zhou, Minxuan ; Lee, Chonghan... - p. 557-563 , 2024
 
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7

DRackSim: Simulating CXL-enabled Large-Scale Disaggregated ..:

, In: Proceedings of the 38th ACM SIGSIM Conference on Principles of Advanced Discrete Simulation,
 
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8

ZEBRA: A Zero-Bit Robust-Accumulation Compute-In-Memory App..:

, In: 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC),
Chen, Yiming ; Yin, Guodong ; Zhong, Hongtao... - p. 153-158 , 2024
 
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9

An FPGA-based Max-K-Cut Accelerator Exploiting Oscillator S..:

, In: 2024 25th International Symposium on Quality Electronic Design (ISQED),
 
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10

CafeHD: A Charge-Domain FeFET-Based Compute-in-Memory Hyper..:

, In: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE),
Li, Taixin ; Zhong, Hongtao ; Wu, Juejian... - p. 1-6 , 2024
 
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11

TroScan: Enhancing On-Chip Delivery Resilience to Physical ..:

, In: 2024 Design, Automation & Test in Europe Conference & Exhibition (DATE),
 
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12

Usas: A Sustainable Continuous-Learning´ Framework for Edge..:

, In: 2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA),
 
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14

Cramming More Weight Data Onto Compute-in-Memory Macros for..:

Yin, Guodong ; Chen, Yiming ; Zhou, Mufeng...
IEEE Journal of Solid-State Circuits.  59 (2024)  6 - p. 1912-1925 , 2024
 
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15

Understanding the Memory Window of Ferroelectric FET and De..:

Qin, Yixin ; Zhao, Zijian ; Lim, Suhwan...
IEEE Transactions on Electron Devices.  71 (2024)  8 - p. 4655-4663 , 2024
 
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